Table 1. HADES requirements for secure testing Property Requirement Comments Secure access Mutual authentication protocol Possibly Challengeresponse Confidentiality Symmetric encryption 1 bit per cycle (avg) ; Random IV against replay attacks Integrity Hashing algorithm Collision resistant, possibly shared with other processes Interfaces Standard compliance Wrappers if needed (AMBA, I2C, CAN, …) Key management Updatable Multiple keys No fixed single global key Group management Attacker model Skilled attacker
The testability of electronic devices is of critical importance and it is often supported by IEEE standards. The presence of test structures, on the other hand, paves the way for malicious attackers to access the circuit and extract confidential knowledge such as secret keys or intellectual property. Removing the access to these structures after manufacturing test may prevent security breaches, but this solution is not definitive and excludes the possibility of advanced uses such as online debugging, diagnosis of designs and on-line updates or monitoring. For this reason, it is important to maintain the test infrastructure but to protect it against threats either external (e.g., attackers) or internal (e.g., hardware trojans). This can be achieved through protocols ensuring authentication added to confidentiality capabilities. In the case of Reconfigurable Scan Networks (RSN -IEEE 1687), some solutions currently exist, but are limited to external threats. In this paper, we review the recent state of the art in the domain, and present a novel solution addressing in a comprehensive and low-cost manner authentication and confidentiality, both inside and outside the device.
The complexity of modern Systems-on-Chips is steadily increasing, which poses hard challenges for testing. In order to be able to face those challenges, several standards have been proposed through history, such as the latest IEEE 1687 on Reconfigurable Scan Networks (RSNs), which allows dynamic configuration of the test infrastructure for an easier access to embedded instruments and data. This ease of access, however, may constitute a serious threat from the point of view of security, as it may be used by an attacker as an entry point to the internal state of the circuit, especially if the test infrastructure is reused for lifetime testing. Some approaches exist to protect the access, but their performances and security levels are limited by the legacy view of test as a static process. In this paper, we propose an innovative solution that exploits the dynamic nature of the IEEE 1687 standard to obtain an Authentication-based Secure Access framework able to provide a trusted and personalized interface to the test infrastructure depending on user-defined security levels.
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