Manganese oxide thin films were deposited on glass substrates by resistive evaporation at room temperature. The layers were produced with electron gun evaporation method under ultra-high vacuum condition. Thickness of the layers was measured 60 and 120 nm, by a quartz crystal method. Deposition conditions such as deposition rate, vacuum pressure, incidence of angle and substrate temperature were the same for all layers. After producing pure manganese oxide layers a post-annealing method was used in the presence of a uniform oxygen flow of 300 (sccm) and at 320 o C annealing temperature. Optical reflectance and transmittance of the layers were measured in the wavelength of 350-850 nm by a spectrophotometer. Kramers-Kronig relations were used to calculate the optical constant. The influence of annealing temperature and oxygen flow on optical properties is investigated. It was found that film thickness and deposition angle plays an important role on the nanostructures as well as optical properties of layers and cause significant variations in behavior of thin titanium oxide films. The physical properties of materials were characterized by X-ray diffraction (XRD), FE-SEM, AFM, EDX, and UV-Vis techniques.
We employed ab-initio calculations to investigate the structural and thermodynamic properties of Massicot or orthorhombic phase of PbO named β -PbO using the projector augmented-wave (PAW) method within the generalized gradient approximation (GGA). The temperature and pressure dependence of bulk modulus, heat capacity at constant pressure and constant volume, entropy, thermal expansion coefficient and Grüneisen parameter were discussed. Accuracy of two different models, the Debye and Debye-Grüneisen which are based on the quasi-harmonic approximation (QHA) for producing thermodynamic properties of material were compared. According to calculation results, these two models can be used to designate thermodynamic properties for β -PbO with sensible accuracy over a wide range of temperatures and pressures, and our work on the properties of this structure will be useful for more deeply understanding various properties of this structure.
Tantalum oxide nanolayers with different thicknesses (30, 60, 90 and 120[Formula: see text]nm) were deposited on glass substrates at a deposition angle of 60∘ under high vacuum condition at room temperature by using electron gun evaporation method. The morphological, structural and optical properties of tantalum oxide nanolayers are investigated by XRD, FESEM, EDX, AFM and spectrophotometer. Kramers–Kronig relations are used to calculate the optical parameters. Optical results show that the real and imaginary parts of the dielectric function, the real part of the refractive index and bandgap energy have increased with increasing film thickness.
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