X-ray structural and spectral analyses, X-ray diffraction topography and metallography were used to study dendrite structure of Al-4 wt % Cu single crystals grown by the Bridgman technique at a rate of 1 mm/min and on seeds with <001> orientation. The single crystals were obtained upon the crystallization of the melt under the action of a pressure and the gravitational-field component directed along the surface of the crystallization front. Non-uniform distribution of copper in the solid solution and the eutectic content has been found in transverse section of single crystals and strong increase in their concentration was observed at the lateral side of the samples in the direction of the gravitational-field component action. Distribution of copper and the eutectic phase depend on pressure.
Computer simulation studies of the structure and the kinetics of motion of interfaces in terms of a lattice model permit the derivation of a general criterion for the transition from the layer to the continuous crystal growth mechanism. This criterion takes into account the relation between the critical driving force and the roughening temperature for interfaces. The coupling constants depend on the structure of the crystals and on the crystallographic orientation of the faces. Materials with different melting entropy and of different types of crystal structures are classified accordingly to the crystal growth mechanisms.
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