Studies on superconducting thin films of vanadium for determining the influence of production parameters are performed. The critical temperature Tc is determined as a function of the film thickness and the dependence of the critical magnetic field Hc∥ and Hc⟂ on the reduced temperature is measured. Moreover the dependence of the critical magnetic field and the critical current density on the angle are measured and the film constants λ, ξ, and x are determined. The experimental values are compared with values, which are calculated from the Ginsburg‐Landau theory.
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