Schottky barrier GaN ultraviolet detectors, both in vertical and in lateral configuration, as well as in a metal–semiconductor–metal geometry were implemented. All devices exhibit a high gain at both reverse and forward bias. The photoresponse in the forward bias is in the positive current direction. We attribute the gain to trapping of minority carriers at the semiconductor–metal interface. The excellent agreement between the calculated responsivity and the experiment indicates that the model is valid for all device structures under study, and represents a unified description of gain mechanism in GaN Schottky detectors.

We describe a parameter extraction technique for the simultaneous determination of physical parameters in nonideal Schottky barrier, p-n and p-i-n diodes. These include the ideality factor, saturation current, barrier height, and linear or nonlinear series, and parallel leakage resistances. The suggested technique which deals with the extraction of bias independent parameters makes use of the forward biased current–voltage (I–V) characteristics and the voltage-dependent differential slope curve α(V)=[d(ln I)]/[d(ln V)]. The method allows (a) establishment of the current flow mechanisms at low and high bias levels, (b) extensive of the permissible ranges of determined parameters beyond what is possible in other published methods, and (c) to automation and computerization of the measurement processes. The method is verified experimentally using metal–semiconductor structures based on Si, InGaP, and HgCdTe as well as an InGaAs/InGaAsP multiple quantum well laser diode exemplifying a p-n junction.

Results of experimental measurements and theoretical analysis are presented for the TiAu/ZnS/CdTe/HgCdTe metal–insulator–semiconductor heterostructure. The passivation of HgCdTe is provided by a double layer consisting of a dielectric ZnS placed on top of an epitaxial CdTe layer. Both HgCdTe and CdTe were grown by metalorganic chemical vapor deposition. Two types of CdTe layers were investigated: one was grown directly, in situ, immediately following the growth of HgCdTe; the second was grown indirectly using previously grown HgCdTe samples. It is shown that directly grown CdTe layers lead to low fixed interface charge, which is a good condition for passivation. The indirectly grown samples are still acceptable, but not as good as the directly grown samples. We demonstrate, on the basis of theoretical considerations, that the dielectric ZnS improves the flatband condition at the CdTe/HgCdTe interface.

Vertical and lateral geometry GaN-based Schottky barrier photodetectors have been implemented, using similar quality material and the same fabrication process. The vertical detector exhibits two orders of magnitude higher responsivity. This is attributed to improved ohmic backcontacts, due to the highly doped buried layer. The vertical detectors exhibits also lower 1/f noise level, which is attributed to the reduced effect of dislocations on the carrier transport, resulting in lower mobility fluctuations. The vertical detector normalized detectivity is four orders of magnitude higher.

Stability of Se passivation layers on Si(001) surfaces characterized by time-of-flight positron annihilation inducedAuger electron spectroscopy