A new system for the direct video display of x-ray diffraction topographs is described. The pattern is converted to an optical signal by a fine-grain fluorescent screen, which is viewed by a video camera through a magnifying optical system. We have achieved a resolution of about 10 μm, suitable for detailed direct observations of individual dislocations in materials such as silicon. The system combines efficient usage of source intensity, large field of vision, and circumvention of an electronic suppression of Kα2 images.
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