Knowledge of the vibrational structure of a semiconductor is essential for explaining its optical and electronic properties and enabling optimized materials selection for optoelectronic devices. However, measurement of the vibrational density of states of nanomaterials is challenging. Here, using the example of colloidal nanocrystals (quantum dots), we show that the vibrational density of states of nanomaterials can be accurately and efficiently measured with inelastic X-ray scattering (IXS). Using IXS, we report the first experimental measurements of the vibrational density of states for lead sulfide nanocrystals with different halide-ion terminations and for CsPbBr perovskite nanocrystals. IXS findings are supported with ab initio molecular dynamics simulations, which provide insight into the origin of the measured vibrational structure and the effect of nanocrystal surface. Our findings highlight the advantages of IXS compared to other methods for measuring the vibrational density of states of nanocrystals such as inelastic neutron scattering and Raman scattering.
The lattice dynamics and elasticity of synthetic SrCO3 have been investigated by a combination of ab initio lattice dynamics calculations, microcalorimetry, Raman spectroscopy, X‐ray thermal diffuse scattering and high‐resolution inelastic X‐ray scattering. The results of density functional based calculations were in all cases in good agreement with experiment. For the spectroscopic investigations, peak positions and intensities are well reproduced by the density functional theory model. Experimentally determined intensity distributions in thermal diffuse scattering maps differ from the theoretical distribution only in the (HK0) plane, a fact that is attributed to stacking disorder. As the model is accurate and reliable, the complete elastic stiffness tensor is predicted and, on the basis of these results, the anisotropy of the sound velocities is discussed, also in relation to the anisotropy in other carbonate systems.
A new diffractometer is now available to the general user community at the ESRF. The new diffractometer is a side station of the high‐resolution inelastic X‐ray scattering spectrometer on beamline ID28 and is located in the same experimental hutch. Both instruments can be operated simultaneously. The new diffractometer combines a fast and low‐noise hybrid pixel detector with a variable diffraction geometry. The beam spot on the sample is 50 µm × 50 µm, where focusing is achieved by a combination of Be lenses and a KB mirror. Wavelengths from 0.5 to 0.8 Å can be used for the diffraction experiments. The setup is compatible with a variety of sample environments, allowing studies under non‐ambient conditions. The diffractometer is optimized to allow a rapid survey of reciprocal space and diffuse scattering for the identification of regions of interest for subsequent inelastic scattering studies, but can also be employed as a fully independent station for structural studies from both powder and single‐crystal diffraction experiments. Several software packages for the transformation and visualization of diffraction data are available. An analysis of data collected with the new diffractometer shows that the ID28 side station is a state‐of‐the‐art instrument for structural investigations using diffraction and diffuse scattering experiments.
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