Particle size measurements of cellulose nanocrystals (CNCs) are challenging due to their broad size distribution, irregular shape and propensity to agglomerate. Particle size is one of the key parameters that must be measured for quality control purposes and to differentiate materials with different properties. We report the results of an interlaboratory comparison (ILC) which examined atomic force microscopy (AFM) data acquisition and data analysis protocols. Samples of CNCs deposited on poly-Llysine coated mica were prepared in the pilot laboratory and sent to 10 participating laboratories including academic, government and industrial organizations with varying levels of experience with imaging CNCs. The participant data sets indicated that the central
Flake thickness is one of the defining properties of graphene-related 2D materials (GR2Ms), and therefore requires reliable, accurate, and reproducible measurements with well-understood uncertainties. This is needed regardless of the production method or manufacturer because it is important for all GR2M products to be globally comparable. An international interlaboratory comparison on thickness measurements of graphene oxide (GO) flakes using atomic force microscopy (AFM) has been completed in Technical Working Area 41 of Versailles Project on Advanced Materials and Standards (VAMAS). Twelve laboratories participated in the comparison project, led by NIM, China, to improve the equivalence of thickness measurement for two-dimensional flakes. The measurement methods, uncertainty evaluation and a comparison of the results and analysis are reported in this manuscript. The data and results of this project will be directly used to support the development of an ISO standard.
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