In this paper we describe the optimization of transmission X-ray targets by Monte-Carlo simulation for a laboratory X-ray microscopy setup. We identified two optimal target layer thicknesses (0.1 µm and 0.7 µm) for a high-resolution target and a high-flux target. Measurements show a decrease in focal spot size by one third or an increase in X-ray flux by a factor of three compared to those of a standard micro-focus target. Focal spot sizes down to 154 nm and 260 nm are achievable with the optimized targets. Simulation results for the X-ray flux match well to the experimental results, whereas the results for the focal spot sizes still show discrepancies attributed to the simplified simulation setup.
We derive a propagator based formalism for optimizing phase contrast imaging in laboratory setups as well as in synchrotron setups. We confirm based on five different setups the well known existence of an optimum position for the sample in terms of phase contrast by measuring two types of fibers and evaluating the fringe contrast. Furthermore, we demonstrate for these setups a correlation of our formula and the fringe contrast. Hence, an estimate of this optimum position is given by our formalism which only depends on the source size, the detector blurring, and the total distance between source and detector.
The application of industrial CT covers many orders of magnitude of object sizes, ranging from freight containers (few meters) down to liquid foams (i.e. for food industry) or even parts of insects which are only several hundreds of micrometers in size. Similarly, the specifications for acquisition speed extend over some orders of magnitude, from hours to sub-second CT. We present the current technology in terms of X-ray sources and detectors, along with numerous applications from industry and materials research: e.g. industrial high-speed CT of car pistons, in situ micro-CT of milk foam decay at micrometer spatial resolution and 8 s scan time, as well as ex situ scans of tensile tested Nickel-alloys. The Fraunhofer Development Center X-ray Technology (Fürth, Germany) and the Chair of X-ray Microscopy (University Würzburg, Germany) are currently working on extending the technological limits, demonstrated, e,g. by the development of advanced X-ray detectors or a new inho use CT system which comprises a high-brilliance liquid metal jet anode
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