3D printing is widely used for manufacturing complex non-functional parts, and recently, the fabrication of electronics has also attracted research attention. The commercialized process of fused-filament fabrication (FFF), which is still evolving,has been used in the preparation of basic electronic conductors and sensors but only a few studies of more complex structures with integrated circuits and passive components have been reported. Notably, the usage of FFF in wearable stretchable electronics has not been studied previously. We demonstrate that the combination of FFF printing and commonly used stretchable electronics materials and methods enables new wearable stretchable electronics. In this study, thermoplastics were extruded directly onto a stretchable substrate and their adhesion was measured using T-peel tests. The test results were further used in the fabrication of supports for meander-shaped screen-printed interconnects. The elongation of the interconnects with the supports were studied by tensile tests with simultaneous measurements of the electrical conductivity. The results were good, and the adhesion exceeded the constitution of the substrate when the filament and the substrate were of the same material type. The average bond strength was ∼2 N mm−1. Support structures placed close to the meander-shaped interconnects changed the interconnects’ deformation under elongation. The average maximum elongation of the interconnects was improved by ∼27% when the supports directed stresses away from the interconnects’ weak areas. Conversely, the results were ∼21% lower when the supports directed stresses towards the weak areas. This study demonstrates that it is possible to use direct 3D printing onto highly stretchable substrates. Currently, commercial FFF materials and methods can be used to manufacture supports, frames and other non-functional parts on wearable electronics substrates in a single process step. We believe that in the future, FFF will become a valuable tool in the manufacture of inexpensive and reliable wearable electronics.
The addition of fillers has been implemented in fused filament fabrication (FFF), and robust carbon fillers have been found to improve the mechanical, electrical, and thermal properties of 3D-printed matrices. However, in stretchable matrices, the use of fillers imposes significant challenges related to quality and durability. In this work, we show that long carbon staple fibers in the form of permeable carbon fiber cloth (CFC) can be placed into a stretchable thermoplastic polyurethane (TPU) matrix to improve the system. Four CFC sample series (nominally 53–159-µm-thick CFC layers) were prepared with a permeable and compliant thin CFC layer and a highly conductive and stiff thick CFC layer. The sample series was tested with single pull-up tests and cyclic tensile tests with 10,000 cycles and was further studied with digital image correlation (DIC) analyses. The results showed that embedded CFC layers in a TPU matrix can be used for stretchable 3D-printed electronics structures. Samples with a thin 53 µm CFC layer retained electrical properties at 50% cyclic tensile deformations, whereas the samples with a thick >150-µm CFC layer exhibited the lowest resistance (5 Ω/10 mm). Between those structures, the 106-µm-thick CFC layer exhibited balanced electromechanical properties, with resistance changes of 0.5% in the cyclic tests after the orientation of the samples. Furthermore, the suitability of the structure as a sensor was estimated.
Stretchable electronics can be realized using different manufacturing methods and hybrids thereof. An example of the latter is the combination of stretchable circuit boards with screen-printing, which will be discussed in this work. The hybrid stretchable electronics structures are based on photolithographically structured and rigid copper islands and screen-printed silver ink interconnections. This enables the assembly of components with a high number of contacts onto the copper islands and deformable silver ink lines between islands. The transition area between islands and lines is critical due to local stress concentration. The effect and potential mitigations were studied by measuring the electrical resistance of test interconnections under mechanical loading. The first set of samples was elongated up to 30 % in tensile tests. The second set of samples was elongated 10 %, 20 %, and 30 % in cyclic tests up to 10.000 cycles. After the tests, extensive failure analysis, e.g., scanning electron microscope, and finite element analysis were conducted.

In tensile tests at maximum load, the interconnections either snap apart or their resistance increases by 640 % in the transition area. Adding protective structures around the transition area, the resistance increase can be reduced to 12 %. Stress concentration in the transition area can be controlled with the layout of the structures, as shown in the cyclic tests. Depending on a layout, the structures protect interconnections in the transition area (resistance < 4 Ω at 10 % and 20 % throughout 10.000 cycles, and up to 5000 cycles at 30 % elongation), or with particular designs, cause fatal damage of the circuitry and fail early. The identified failure mechanism is typically fatigue damage caused by the repeated bending of the protective structure. The observed resistance increase at the interface was closely related to the crack propagation phase in the protective structures.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
hi@scite.ai
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.