We report the growth of horizontally aligned arrays and networks of GaN nanowires (NWs) as resonant components in nanoelectromechanical systems (NEMS). A combination of top-down selective area growth (SAG) and bottom-up vapor-liquid-solid (VLS) synthesis enables flexible fabrication of highly ordered nanowire arrays in situ with no postgrowth dispersion. Mechanical resonance of free-standing nanowires are measured, with quality factors (Q) ranging from 400 to 1000. We obtained a Young's modulus (E) of approximately 338 GPa from an array of NWs with varying diameters and lengths. The measurement allows detection of nanowire motion with a rotating frame and reveals dual fundamental resonant modes in two orthogonal planes. A universal ratio between the resonant frequencies of these two fundamental modes, irrespective of their dimensions, is observed and attributed to an isosceles cross section of GaN NWs.
Deep level defects in the multi-quantum well (MQW) region of InGaN/GaN light emitting diodes (LEDs) were investigated. InGaN quantum well and GaN quantum barrier defect states were distinguished using bias-dependent steady-state photocapacitance and deep level optical spectroscopy, and their possible physical origin and potential impact on LED performance is considered. Lighted capacitance-voltage measurements provided quantitative and nanoscale depth profiling of the deep level concentration within the MQW region. The concentration of every observed deep level varied strongly with depth in the MQW region, which indicates evolving mechanisms for defect incorporation during MQW growth.
The influence of threading dislocation (TD) density on electroluminescence and deep level defect incorporation in the multi-quantum well regions of InGaN/GaN light emitting diodes (LEDs) was investigated. LED efficiency increased with decreasing TD density. To elucidate the impact of TD density on deep level defect incorporation and resulting radiative efficiency, deep level optical spectroscopy and lighted capacitance voltage measurements were applied to the LEDs. Interestingly, the concentration of all observed deep levels decreased with TD density reduction, but their concentration also varied strongly with depth in the multi-quantum well region. These trends indicate that (1) TDs strongly influence point defect incorporation in InGaN/GaN LEDs and (2) TDs, possibly in conjunction with point defects, are detrimental to LED efficiency.
The dependence of (Al)GaN/AlGaN multiquantum well (MQWs) optical efficiency and defect incorporation on the growth temperature (Tg) of the optically active region was investigated. Marked increase in MQW photoluminescence (PL) intensity was observed for increasing Tg. Correspondingly, increasing Tg also significantly reduced point defect incorporation under QW growth conditions, as determined by deep level optical spectroscopy. It is suggested that enhanced MQW PL with increasing Tg resulted from improved nonradiative lifetime through reduced nonradiative defect density in the MQW region.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.