Thermal oxidation process of silicon carbide (SiC) has been studied by performing in-situ spectroscopic ellipsometry. In our previous work, we, for the first time, found that the growth rates of SiC(000 " 1 1) C-face at oxidation thicknesses less than around 20 nm are much higher than those given by the Deal-Grove (D-G) model. In this report, we show that such a growth rate enhancement occurs also in the oxidation of SiC(0001) Si-face. By applying the empirical equation proposed by Massoud et al. [J. Electrochem. Soc. 132 (1985) 2685] to the oxidation of SiC Si-face and comparing the temperature and oxygen partial pressure dependences of oxidation rate parameters obtained with those for C-face, we discuss the difference in oxidation mechanism between SiC Si-and C-faces.
The thermal oxidation of silicon carbide (SiC) has been studied by performing in-situ ellipsometry. We have found that the oxidation rates at the oxidation thickness of approximately less than around 20 nm are much larger than those given using the Deal-Grove (D-G) model, suggesting that the oxidation time dependence of the oxide thickness cannot be explained using the D-G model, i.e., a simple linear-parabolic model, in the initial oxidation stage. By using the empirical relation, which has been proposed for Si oxidation, i.e., adding an exponential term to the D-G equation, the origin of the growth rate enhancement in SiC oxidation has been discussed.
AVSTRACTThe purpose of this study was to refine the items on a scale measuring interprofessional collaborative competency that was developed by the authors in an earlier pilot study. A questionnaire-based study was conducted with a sample of 2133 health professionals using the reformulated questionnaire. Construct validity was tested by comparing the survey results with a covariance structure analysis and the domains of interprofessional collaboration competencies presented in previous studies. A second survey was conducted 2 weeks later with a sample of 571 nursing professionals, using the same survey form to test its reliability. We constructed a model comprising 29 observed variables and six latent variables (the Chiba Interprofessional Competency Scale: CICS29), and obtained the following values for the model's goodness of fit: GFI = 0.925, AGFI = 0.908, CFI = 0.950, RMSEA = 0.049. With regard to reliability, we obtained scores ranging from 0.65 to 0.77 for the intraclass correlation coefficients of the six domains. Compared with the interprofessional collaboration scales indicated in previous studies, the CICS29 was found to have subsumed the key concepts that should be configured as interprofessional collaboration competencies. The CICS29 appeared to have satisfactory levels of reliability and validity and is recommended as a scale for measuring competencies of interprofessional practice. ARTICLE HISTORY
Real time observations of SiC (000–1) C-face and (0001) Si-face oxidation were performed using an in-situ ellipsometer over the oxygen-partial-pressure range from 0.1 to 1.0 atm. We analyzed the relations between oxide growth rate and oxide thickness by applying an empirical relation proposed by Massoud et al. We found the occurrence of oxidation enhancement in the thin oxide regime also for Si-face as well as for C-face. We have discussed the oxygen-partial-pressure dependence of the oxidation rate constants between SiC C- and Si face, comparing with that of Si.
This paper describes a mechanism to explain the lattice bowing of freestanding GaN substrates grown by hydride vapor phase epitaxy on sapphire substrates. The freestanding GaN substrates typically exhibit a concave shape. It is revealed that the radius of curvature and lattice constant of the top surface are almost the same as those of the bottom surface. This is indicative of the complete relaxation of the GaN lattice, even though the freestanding GaN substrate exhibited a curvature. It is shown that dislocations are present in a plane normal to the growth direction in addition to conventionally known threading dislocations; these are referred to as in-plane dislocations. Based on these results, it is proven quantitatively that the extra-half planes related to the in-plane dislocations are primarily responsible for the phenomenon of lattice bowing.
Aim:This study aimed to clarify the association between nurses' job satisfaction, interprofessional collaborative competency and other related factors in university hospitals in Japan. Background:Enhancing a team's function in the university hospital setting requires strengthening each professional's competency: high-level professional competency leads to high job satisfaction. Methods:In 2014, self-administered questionnaires were sent to all nurses working at two university hospitals in Japan. A multivariate analysis of variance was conducted to evaluate the relationship between job satisfaction as the response variable and interprofessional collaborative competency and other variables as the independent variables.Results: Data from 913 nurses were used in the present analysis (response rate: 60.4%). Two factors from the Chiba Interprofessional Competency Scale 29 (factor 1: attitudes and beliefs as a professional; factor 5: attitudes and behaviours that improve team cohesion) and opportunities for information exchange with other professionals outside the hospital had significant relationships with job satisfaction. Conclusion: Strengthening interprofessional collaborative competency and increas-ing opportunities for information exchange with professionals outside the hospital would improve nurses' job satisfaction in university hospitals. Implications for nursing management:Interprofessional collaborative competency and opportunities for information exchange with other professionals are worth the attention of nursing administrators. K E Y W O R D S clinical competence, information seeking behavior, interprofessional relations, job satisfaction, patient care team How to cite this article: Majima T, Yamamoto T, Sakai I, Ikezaki S, Nagasaka I. Job satisfaction and related factors of nurses in university hospitals: Focusing on collaborative competency factors.
The objective of this study was to develop and test a competency scale, which measures the competency of interprofessional collaborative practice of health professionals. A total of 32 health professionals were interviewed, and then an item pool of 255 items was created to measure the competency of interprofessional collaboration. A questionnaire study was conducted with 1552 health professionals from four different hospitals located in the Kanto region of Japan. The questionnaires were distributed and collected by gatekeepers in each section. The valid response rate was 62.6%. There were a total of 65 questionnaire items measuring the competency of interprofessional collaboration. Each item was assessed by the number of valid responses, distribution of scores, item-total correlation analysis and good-poor analysis. Construct validity was assessed using factor analysis and the relationships among the total scores of each factor with interprofessional education experience during education before and after graduating. Moreover, Cronbach's alpha coefficient was calculated to assess reliability. Finally, 30 items were excluded, and a scale for interprofessional collaborative competency comprising 35 items and 6 factors was developed. From the perspective of construct validity and internal consistency, the scale in its pilot form shows some promising aspects.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
hi@scite.ai
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.