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We propose and demonstrate a terahertz ͑THz͒ time-domain spectroscopy combined with ellipsometry. The complex optical constants of a Si wafer with low resistivity are deduced from the measurements of the wave forms of reflected sand p-polarized THz pulses without reference measurement. The obtained dispersion of refractive index above ϳ0.2 THz shows good agreement with that predicted by the Drude theory. The complex optical constants deduced by the THz ellipsometry in the low-frequency region are strongly affected by the slight error of the ellipsometric angle originating mainly from the misalignment of the rotation angles of the polarizer and analyzer.

We report on the observation of terahertz ͑THz͒ radiation emitted from antiferromagnetic ͑AFM͒ single-crystal nickel oxide irradiated with femtosecond laser pulses. Periodic oscillations observed in the THz waveforms are assigned to the radiation from coherent AFM magnons excited by the laser pulses. Impulsive stimulated Raman scattering process is a possible mechanism of the coherent AFM magnon excitation by the laser pulses. The excited magnons in NiO generate THz waves by magnetic dipole radiation, which is the inverse process of AFM resonance absorption of THz waves.

Spectroscopies using terahertz (THz) radiation excited by ultrashort laser pulses have been rapidly developing recently. In this paper, the principles of various types of THz time domain spectroscopies (THz TDSs), i.e. transmission-, reflection-and ellipsometry-type THz TDSs, and their applications to the characterization of semiconductors are described. In addition to the THz TDS using a femtosecond laser, a sub-THz TDS system using a cheap and compact continuous multimode laser diode is also described.

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