Ferroelectric BiFeO3 thin films have been deposited on Pt/TiO2/SiO2/Si substrate by pulsed-laser deposition. From the X-ray diffraction analysis, the BiFeO3 thin film consists of perovskite single-phase, and the crystal structure shows the tetragonal structure (c/a = 1.018) with a space group P4m
m. It is obtained that the BiFeO3 thin film shows a well-saturated remarkably giant saturation polarization of 158 µC/cm2 and a remanent polarization of 146 µC/cm2 for a maximum applied voltage of 20 V at 90 K. These values of polarization are largest ever-measured in ferroelectrics.
Ferroelectric BiFeO3 thin films were grown on Pt ∕TiO2∕SiO2∕Si substrates by pulsed-laser deposition. From the x-ray diffraction analysis, the BiFeO3 thin films consist of perovskite single phase, and the crystal structure shows the tetragonal structure with a space group P4mm. The BiFeO3 thin films show enhanced electrical properties with low leakage current density value of ∼10−4A∕cm2 at a maximum applied voltage of 31V. This enhanced electrical resistivity allowed the authors to obtain giant ferroelectric polarization values such as saturation polarizations of 110 and 166μC∕cm2 at room temperature and 80K, respectively.
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