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i Commissariat à l'énergie atomique et aux énergies alternatives, DEN Cadarache, France; j Commissariat à l'énergie atomique et aux énergies alternatives,The basic principle of SIMS is that a focused beam of energetic ions (so-called primary ions) is targeted onto the surface of a solid sample. Primary ions dissipate their energy, leading to the sputtering and ionisation of the outmost atoms of the sample surface. The resulting secondary ions are accelerated and transferred to a magnetic analyser.

DOI = 10.3126/hjs.v5i7.1230 Himalayan Journal of Sciences Vol.5(7) (Special Issue) 2008 p.19