Signature testing is proposed for integrated circuit testing. One of the problems in signature testing is that not all the errors contained in the test response from the tested circuit can be detected (aliasing error). In this paper, the following results are shown: (1) utilizing the property of the maximum distance separable code, the aliasing probability of the multiple‐input signature register (MISR) is formulated. It is shown that the aliasing error probability of the MISR does not depend on the selected polynomial. In addition, it is shown that there is no fluctuation as is observed in the case of single‐input linear feedback shift registers (LFSR); (2) the aliasing error of the multiplexed MISR based on the primitive polynomials is analyzed using the weight distribution of the Reed‐Solomon codes. It is also shown that there is no fluctuation as is observed in single‐input LFRS; (3) the aliasing probability for single‐input LFSR is analyzed using a computer program. It is verified that the aliasing probability of single‐input LFSRs has different properties depending on the selected primitive polynomial. The fluctuation in the aliasing probability is observed.
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