We have fabricated interface-engineered junctions with YbBa2Cu3Oy as the counterelectrode. The junctions fabricated on YBa2Cu3Oy base electrodes exhibited excellent Josephson characteristics with the 1σ-spread in Ic as low as 5.4% for 16 junctions with an average Ic of around 1 mA. We also confirmed that the 1σ in Ic correlates with the surface morphology of the base-electrode layer, indicating that further improvements in 1σ would be possible by advancing the thin-film growth technology.
The effects of deforestation on carbon balance in a natural tropical peat swamp forest were evaluated by micrometeorological monitoring.The monitoring sites were the primary forest at To-Daeng and the secondary forest at Bacho in Narathiwat Province, Thailand.The concentration gradient method (CG) and the relaxed eddy accumulation method (REA) were used to estimate the CO2 flux above the canopies. We estimated the annual amount of carbon absorption for both sites, using the relationship between CO2 flux and solar radiation for each site. An annual net carbon absorption of 5.32t C ha-1 year-1, was estimated for the primary forest. The accumulation of the released organic matter from the forest into logged-water caused the net carbon absorption in the peat swamp forest. In the secondary forest, annual net carbon absorption was estimated at 5.22 t C ha-1 year-1, which is almost the same range of absorption as the primary forest, because of plant growth in the secondary forest. A greater quantity of net carbon absorption, 9.69t C ha-1 year-1, was expected, assuming that the ground surface remained water-logged throughout the year. On the other hand, assuming it remained dry throughout the year, a net carbon emission of -0.40 t C ha-1 year-1, was expected.
Electron-beam-induced soft-X-ray emission spectroscopy (SXES) that uses a grating spectrometer has been introduced to a conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The spectrometer was designed as a grazing incidence flat-field optics by using aberration corrected (varied line spacing) gratings and a multichannel plate detector combined with a charge-coupled device camera, which has already been applied to a transmission electron microscope. The best resolution was confirmed as 0.13 eV at Mg L-emission (50 eV), which is comparable with that of recent dedicated electron energy-loss spectroscopy instruments. This SXES-SEM instrument presents density of states of simple metals of bulk Mg and Li. Apparent band-structure effects have been observed in Si L-emission of Si wafer, P L-emission of GaP wafer, and Al L-emissions of intermetallic compounds of AlCo, AlPd, Al2Pt, and Al2Au.
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