An atomic force microscope cantilever has been used as a bending-beam sensor to measure surface stress changes which occur during electrochemical processes. The mechanical properties of the lever and the sensitivity of the detection system mean that the sensor is both fast and sensitive. Surface stress changes presented for the electrochemical deposition and stripping of a Pb monolayer on an Au(111) surface show features which match peaks in the cyclic voltammogram and can be understood by reference to the known surface structure determined by STM, AFM, and grazing incidence XRD. There is a pronounced reduction in the stress derivative at the potential corresponding to the rotational phase transition of the lead monolayer. In the electrocompression region which follows monolayer formation, there is an essentially linear increase in compressive stress which may be modeled to within 50% accuracy by a simple linear elastic model.

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Simple, sensitive, and fast sensors can be constructed from standard atomic force microscopy cantilevers. For use in liquid environments, it is preferable to use changes in surface stress as the measurement basis of the sensor. We have constructed such a sensor in an electrochemical cell so that simultaneous cyclic voltammograms and strain measurements can be made. This is demonstrated with examples of underpotential deposition of Pb on Au(111) and electrocapillary effects in KCl.

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Cantilevers developed for atomic force microscopy can be used to construct sensitive thermal and stress sensors. We have shown how the stress changes which accompany deposition and desorption may be measured on single crystal electrodes. In this work we describe the surface stress changes associated with three processes: the electrodeposition of Pb and I and desorption of self assembled thiol monolayers on the Au(111) surface.