In this work, a high-density hydrogen (HDH) treatment is proposed to reduce interface traps and enhance the efficiency of the passivated emitter rear contact (PERC) device. The hydrogen gas is compressed at pressure (~ 70 atm) and relatively low temperature (~ 200 °C) to reduce interface traps without changing any other part of the device’s original fabrication process. Fourier-transform infrared spectroscopy (FTIR) confirmed the enhancement of Si–H bonding and secondary-ion mass spectrometry (SIMS) confirmed the SiN/Si interface traps after the HDH treatment. In addition, electrical measurements of conductance-voltage are measured and extracted to verify the interface trap density (Dit). Moreover, short circuit current density (Jsc), series resistance (Rs), and fill factor (F.F.) are analyzed with a simulated light source of 1 kW M−2 global AM1.5 spectrum to confirm the increase in cell efficiency. External quantum efficiency (EQE) is also measured to confirm the enhancement in conversion efficiency between different wavelengths. Finally, a model is proposed to explain the experimental result before and after the treatment.
Highly sensitive, simple and reliable colorimetric probe for Cu2+-ion detection was visualized with the L-cysteine functionalized gold nanoparticle (LS-AuNP) probes. The pronounced sensing of Cu2+ with high selectivity was rapidly featured with obvious colour change that enabled to visually sense Cu2+ ions by naked eyes. By employing systemic investigations on crystallinities, elemental compositions, microstructures, surface features, light absorbance, zeta potentials and chemical states of LS-AuNP probes, the oxidation-triggered aggregation effect of LS-AuNP probes was envisioned. The results indicated that the mediation of Cu2+ oxidation coordinately caused the formation of disulfide cystine, rendering the removal of thiol group at AuNPs surfaces. These features reflected the visual colour change for the employment of tracing Cu2+ ions in a quantitative way.
This study proposes a promising silicon (Si) solar cell structure for reducing the potential induced degradation (PID) of crystalline Si solar cells. Phosphorous silicate glass (PSG) layers were carefully designed on an emitter layer, and the thickness of these layers (d PSG ) was controlled by adjusting the diffusion temperature and time. The results show that the power loss remarkably decreased from 31% (d PSG = 0 nm) to 11% (d PSG = 22.3 nm) and further decreased to less than 5% after a 48-h PID test when d PSG In recent years, the number of large photovoltaic (PV) systems for generating high electricity has increased. Such PV systems contain numerous high power PV modules. Therefore, the durability of a PV module is imperative.1 The potential induced degradation (PID) of crystalline silicon (Si) solar cells, first observed by Sunpower in 2005, has drawn considerable attention in recent years. [2][3][4][5][6] This is because the local electrical short-circuiting of the pn-junction in a Si solar cell occurs under high voltage stress, which leads to a substantial reduction in the power of a module.
7Several approaches can be used to prevent PID from cell to module levels. For example, leakage current can be reduced by changing the cover glass and encapsulation materials. [8][9][10] However, applying these approaches increases the cost drastically and may cause the efficiency of solar cells to deteriorate. The soda-lime cover glass and ethylene vinyl acetate (EVA) are still the most widely used and low-cost packaging materials for solar modules. Strong demand has necessitated the modification of the antireflective layers or emitter layers in PID-resistant solar cells. However, risks should be noticed that an efficiency of a solar cell and throughput may be reduced.This study proposes a promising Si solar cell structure for reducing the PID of solar cells without influencing their efficiency and throughput. Phosphorous silicate glass (PSG) layers were carefully designed on an emitter layer to determine how they affect the efficiencies of solar cells before and after PID. A current-voltage (I-V) tester was used to determine PV parameters. An ellipseometer and transmission electron microscope (TEM) were used to measure the thicknesses of the PSG layers. Secondary ion mass spectrometry (SIMS) was used to obtain concentration profiles of Si, sodium (Na), phosphorus (P), oxygen, and nitrogen. Figure 1 shows the process flow in this study as well as the structure of a solar cell with a PSG layer. Solar-grade and monocrystalline Si wafers with a size and resistivity of 5 in 2 and 0.5-3.0 ·cm, respectively, were used in this study. These wafers were processed using the following procedures: texturization by using an alkaline solution, P diffusion by using POCl 3 as a precursor, removing PSG layers by using a dilute HF solution (for standard solar cells only), depositing SixNy films as antireflection coatings by using a plasma enhanced chemical vapor deposition, and forming front and rear contacts by performing screen-p...
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