In this paper, a fast li-ion battery charger microcontroller (MCU) based on configurable pulse width modulation (PWM) controller by tracking the polarization curve of battery cells is proposed in order to inject the maximum charge-current without battery degradation and its fully customdesigned MCU is implemented as a system-on-chip (SoC) using 0.18 um Embedded Flash CMOS process. The evaluation results show that a newly designed charger is about 18.6% faster than the conventional constantcurrent (CC) charging method with the temperature rise within a reasonable range. The implemented charger system by tracking the battery cell polarization curve results in charging 4 cells of battery to about 80% of its maximum capacity in less than 56 minutes and 13°C maximum temperature rise without damaging the battery.
A low-power sync processor chip for 3DTV shutter glasses has been proposed and implemented. The proposed sync processor adopts a newly designed floating point timer to synchronize without any sync reception and an edge tracer for universal sync-packet detection without running the CPU. The floating-point timer allows the input wireless sensor to be turned off, and the edge tracer enables the CPU to hibernate most of the time to reduce the current. The implemented chip uses less than about 25% of the operating current that major commercial shutter glasses use. (Keywords: low power design, stereoscopic vision, independently clocked system, fractional order circuits, and systems) 3DTV and Active Shutter GlassesNew demands for the home 3DTV theater are beginning to grow. Many electronic appliance companies have adopted the LCD active shutter glasses to implement the 3D vision effect [1]. Fig 1 illustrates the 3DTV system using active shutter glasses and the proposed sync processor architecture. The 3DTV implementation based on the active shutter glasses requires continuously transmitting sync packets for each left and right image to synchronize with the 3DTV shutter glasses [1]. Unfortunately, the 3DTV users often suffer from the flicker effect caused by the cross-talk described in Fig 2 when the 3DTV shutter glasses miss the sync information due to external noise [2]. The software exception-handling technique and hardware resources [3] are required to filter the noise embedded in the normal sync packets. MotivationPrevious work [4] focused on the noise between the 3DTV and shutter glasses. Because the 3DTV shutter glasses are battery operated, the operating current is also important. In this paper, the key concept to overcoming the power and noise issues is to synchronize two independently clocked systems (3DTV and glasses) without the sync packet transmission. Without the sync information, the accumulation of the synchronization error occurs which is described in Fig 3, caused by the conventional fixed-point timer [5]. To compensate for and possibly eliminate the accumulation of errors, we present a newly designed timer operated in fractional order scale. The software processing to filter the noise effect requires additional CPU resource time and leads to increased power consumption. When our edge tracer tracks the incoming packets into the internal SRAM buffer, the CPU can hibernate to reduce the operating current. The CPU wakes up from the sleep state to quickly analyze the tracked packets. Architecture Fig 4 and Fig 5 show the conventional timer to measure the input sync duration on an integer-order scale. Due to the two independently clocked systems used for the 3DTV and active shutter glasses, the synchronization based on the fixed-point timer only evokes a fraction of the error caused by the sync timer. If the sync packet is absent, the synchronization error will gradually increase. Fig 5 shows the accumulation of the fractional error when input sync information is absent. Fig 6 and Fig 7 show the proposed f...
ABSRACTRecently, the scatterometry is becoming more and more popular as a inline metrology tool for lithography process control as well as etching process control because of the advantage of fast measurement with high accuracy. Especially, at the gate patterning that fabricates transistors, the scatterometry can be very powerful because it gives massive volume of CD (Critical Dimension) measurement data and gate poly profile, simultaneously. Those results could help to understand and forecast the performance of transistors. In order to achieve accurate and consistent measurement results by scatterometry, the setup of stable model and library is very crucial since it has nature of indirect measurement. For example, as defining of substrate conditions, modeling range of parameters, target values and type of models, scatterometry ( in this paper, we call as OCD ; Optical CD) gives different results even if we use same data basis. In this paper we have shown the best practice how to optimize variables of scatterometry to get accurate and stable results. We used the OCD(Optic CD: Accent CDS200) angular scatterometry system which can rotate HeNe laser light source from -47 to +47 degree.In order to investigate the substrate dependency, various silicon wafer substrates having periodic patterned with different materials such as photoresist, BARC, poly silicon, and thermal oxide film has been used. Finally, we observed OCD has the excellent capability for inline process controllability. INTRODUCTONThe recent application of scatterometry in semiconductor process is to real time CD measurement tool for lithography and etching. As continuously shrinking design rule in semiconductor technology node, the process margin is becoming narrower and it makes hard to control. The excellent metrology
Processors require both intensive and extensive functional verification in their design phase to satisb their general purposability. The proposed random vector verification method for CalmRISCTM-32 core meets this goal by contributing complementary assistance for conventional verification methods. It adopts a cycle-accurate instruction level simulator as a reference model, runs simulation in both the reference and the target HDL and reports errors ifany difference is found between them. These processes are automatically performed in the unifed environment. The instruction level simulator, the core part in the verijkation environment is able to simulate almost every aspect of RISC processors from functional behavior of each opcode to timing details in the pipeline flow in fast speed. Its design style from microprogramming scheme also makes its structure modular and flexible.
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