We report the spontaneous formation of superconducting NiBi3 phase in thermally evaporated Ni-Bi bilayer films. High reaction-diffusion coefficient of Bi is believed to drive the formation of NiBi3 during the deposition of Bi on the Ni film. Cross sectional transmission electron microscopy and glancing incidence X-ray depth profiling confirmed the presence of NiBi3 throughout the top Bi layer. Superconducting transition at ∼3.9 K, close to the bulk value, was confirmed by transport and magnetization measurements. The bilayers were irradiated with varying fluence of 100 MeV Au ions to study the robustness of superconducting order in presence of large concentration of defects. Superconducting parameters of NiBi3, such as transition temperature and upper critical field, remained unchanged upto an ion dose of 1 × 1014 ions/cm2. The diffusive formation of NiBi3 in Ni opens the possibility of studying superconducting proximity effect at a truly clean superconductor-ferromagnet interface.
Bulk Ge15Te83Si2 glass has been found to exhibit memory-type switching for 1mA current with a threshold electric field of 7.3kV∕cm. The electrical set and reset processes have been achieved with triangular and rectangular pulses, respectively, of 1mA amplitude. In situ Raman scattering studies indicate that the degree of disorder in Ge15Te83Si2 glass is reduced from off to set state. The local structure of the sample under reset condition is similar to that in the off state. The Raman results are consistent with the switching results which indicate that the Ge15Te83Si2 glass can be set and reset easily.
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