The novel 4T Design(1), though efficient, has several parasitic effects of 1 st Generation accumulated in it. These parasitic effects are discussed in this paper. After testing the prototype, it was observed that effects like body effect, drain actuation etc. are still present in the system. This paper discussed them all and provides a key to solve the issues rising from these effects.
The logic construction of a double-edge-triggered (DET) flipflop, which can receive input signal at two levels of the clock, is analyzed and a new circuit design of CMOS DET flip-flop is proposed. Simulation using SPICE and a 1 micron technology shows that this DET flip-flop has ideal logic functionality, a simpler structure, lower delay time and higher maximum data rate compared to other existing CMOS DET flip flops. By simulating and comparing the proposed DET flip-flop with the other designs present, it is shown that the proposed DET flip-flop reduces power dissipation while keeping the same date rate and can be used for high speed applications.
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