We report tunable in-plane anisotropic magnetoresistance (AMR) in nanodevices based on topological insulator BiSbTeSe2 (BSTS) nanoflakes by electric gating. The AMR can be changed continuously from negative to positive when the Fermi level is manipulated to cross the Dirac point by an applied gate electric field. We also discuss effects of the gate electric field, current density, and magnetic field on the in-plane AMR with a simple physical model, which is based on the in-plane magnetic field induced shift of the spin-momentum locked topological two surface states that are coupled through side surfaces and bulk weak antilocalization (WAL). The large, tunable and bipolar in-plane AMR in BSTS devices provides the possibility of fabricating more sensitive logic and magnetic random access memory AMR devices.

BiFeO3 thin films with a mixture of tunable R-like and c axis elongated low symmetry phase (T-like phase) are fabricated on STO (001) substrate through controlling of the substrate temperature. Almost pure T-like phase can be grown on STO substrate at 600°C. Comparing with the situations on LAO (001), it is found that, strains from the LAO substrate may be the only reason that induces the T-like phase at higher temperatures. At lower temperatures, the island growth induced strains alone can also generate T-like phase on STO substrate