Solution of octadecylphosphonic acid in anisole enables formation of a full-coverage monolayer on metal oxides in a matter of seconds.

We demonstrated that the ion intensity ratio of C H to C H detected in TOF-SIMS provides a unique and simple means to assess the degree of cross-linking of the surface of PMMA films cross-linked by the surface sensitive hyperthermal hydrogen projectile bombardment technique. With a C sputter beam, we were able to depth profile the PMMA films and determine cross-linking depths of the cross-linked polymer films at nanometer resolutions. Copyright © 2017 John Wiley & Sons, Ltd.