Abstract. Aim of this paper is to investigate the effect of annealing time of titanium oxide (TiO 2 ) thin film on structural and electrical properties. TiO 2 were deposited onto glass substrates by spray pyrolysis method. The thin films were annealed at three different annealing time; 1, 5 and 10 hours at 400°C. The structural and electrical properties were characterized using FESEM, I-V probe and solar simulator. Polycrystalline thin film with anatase crystal structure, as evidenced from X-ray diffraction pattern, was obtained with major reflection along (101). As anneal time increased the crystallite grain size is increased, thickness of TiO 2 decreased, power conversion efficiency, Ƞ increased from 0.0001% to 2.28% and percentage of IPCE increased at 520nm for transmission spectra of DSSC.
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