The complexity of electronic systems for RF and digital applications is ever increasing, and the corresponding compliance analysis for ensuring the required specifications in terms of performances, signal and power integrity is a challenging task often accomplished by relying on commercial circuit simulators. The modeling of multiport devices involves the assembly of electrical networks usually described in terms of S-parameter. This work proposes a new single-step algorithm that computes the global S-parameter matrix for a cascade of multiple networks with multiple ports without the need of any S-parameter transformation in T-parameters and their inverse transformation. The proposed method involves the construction of a large matrix filled with all S-parameters of all networks, and the subsequent evaluation of only one matrix expression. The proposed method is shown to be very efficient and reliable, since it can be easily automated without the need of a manual connections of tens or even hundreds of ports of the multiple blocks, which is an action that needs to be performed within a typical circuit simulator environment. Also, the proposed method overcomes the limitation of the standard method based on S-to-T parameter transformation since it is of general applicability to networks with different number of input and output ports. Examples involving the cascade of multiple 2-ports and multiports networks are considered, and the results are validated and compared with the reference results obtained from a commercial circuit simulator. The proposed method is shown to be effective and fast compared to its counterpart based on the T-parameters.
The de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique consists in removing the effects of the measurement fixtures by the calculation of the transfer scattering parameters (T-parameters) from the available measured (or simulated) global scattering parameters (S-parameters). The standard de-embedding is achieved by a multiple steps process, involving the S-to-T and subsequent T-to-S parameter conversion. In a typical measurement setup, two fixtures are usually placed before and after the device under test (DUT) allowing the connection of the device to the calibrated vector network analyzer coaxial ports. An alternative method is proposed in this paper: it is based on the newly developed multi-network cascading algorithm. The matrices involved in the fixture-DUT-fixture cascading gives rise to a non-linear set of equations that is in one step analytically solved in closed form, obtaining a unique solution. The method is shown to be effective and at least as accurate as the standard multi-step de-embedding one.
The de-embedding is a technique used in radio frequency and signal integrity measurements to extract the scattering (S)-parameters of the device under test (DUT) from the measured data of a global assembly and based on known S-parameters of the left and right test fixtures; thus, it removes the impact of the text fixtures used for the connection of the DUT to the instrumentation. Once the S-parameters are measured, the de-embedding is performed by a multistep approach involving the bidirectional transformation of the S-parameters into the corresponding transfer scattering (T)-parameters. The latter approach is well established for two-and four-port networks and has been recently expanded to the multiport case. This work proposes an alternative analytical formulation to de-embed a multiport device, knowing in advance only the S-parameters of the global multiport assembly and those of the test fixtures. The proposed method does not involve the S-to-T conversion and it requires only the algebraic manipulation of the S-parameter matrix elements; its practical implementation is very well fitted especially for multiport cases, and it is very fast in calculating the de-embedded DUT S-parameters for large port numbers. The results of the proposed formulation, applied to the case of a multipin high-speed connector, are compared with those obtained by measurement and simulations.Their accuracy is shown and discussed to demonstrate the validity of the proposed approach.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
hi@scite.ai
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.