Human brain tissue belongs to the most impressive and delicate three-dimensional structures in nature. Its outstanding functional importance in the organism implies a strong need for brain imaging modalities. Although magnetic resonance imaging provides deep insights, its spatial resolution is insufficient to study the structure on the level of individual cells. Therefore, our knowledge of brain microstructure currently relies on two-dimensional techniques, optical and electron microscopy, which generally require severe preparation procedures including sectioning and staining. X-ray absorption microtomography yields the necessary spatial resolution, but since the composition of the different types of brain tissue is similar, the images show only marginal contrast. An alternative to absorption could be X-ray phase contrast, which is known for much better discrimination of soft tissues but requires more intricate machinery. In the present communication, we report an evaluation of the recently developed X-ray grating interferometry technique, applied to obtain phase-contrast as well as absorption-contrast synchrotron radiation-based microtomography of human cerebellum. The results are quantitatively compared with synchrotron radiationbased microtomography in optimized absorption-contrast mode. It is demonstrated that grating interferometry allows identifying besides the blood vessels, the stratum moleculare, the stratum granulosum and the white matter. Along the periphery of the stratum granulosum, we have detected microstructures about 40 mm in diameter, which we associate with the Purkinje cells because of their location, size, shape and density. The detection of individual Purkinje cells without the application of any stain or contrast agent is unique in the field of computed tomography and sets new standards in non-destructive three-dimensional imaging.
We report on the design and experimental realization of a 2D x-ray grating interferometer. We describe how this interferometer has been practically implemented, discuss its performance, and present multidirectional scattering (dark-field) maps and quantitative phase images that have been retrieved using this device.
Recently a novel grating based x-ray imaging approach called directional x-ray dark-field imaging was introduced. Directional x-ray dark-field imaging yields information about the local texture of structures smaller than the pixel size of the imaging system. In this work we extend the theoretical description and data processing schemes for directional dark-field imaging to strongly scattering systems, which could not be described previously. We develop a simple scattering model to account for these recent observations and subsequently demonstrate the model using experimental data. The experimental data includes directional dark-field images of polypropylene fibers and a human tooth slice.
It is known that the sensitivity of X-ray phase-contrast grating interferometry with regard to electron density variations present in the sample is related to the minimum detectable refraction angle. In this article a numerical framework is developed that allows for a realistic and quantitative determination of the sensitivity. The framework is validated by comparisons with experimental results and then used for the quantification of several influences on the sensitivity, such as spatial coherence or the number of phase step images. In particular, we identify the ideal inter-grating distance with respect to the highest sensitivity for parallel beam geometry. This knowledge will help to optimize existing synchrotron-based grating interferometry setups. Abstract: It is known that the sensitivity of X-ray phase-contrast grating interferometry with regard to electron density variations present in the sample is related to the minimum detectable refraction angle. In this article a numerical framework is developed that allows for a realistic and quantitative determination of the sensitivity. The framework is validated by comparisons with experimental results and then used for the quantification of several influences on the sensitivity, such as spatial coherence or the number of phase step images. In particular, we identify the ideal intergrating distance with respect to the highest sensitivity for parallel beam geometry. This knowledge will help to optimize existing synchrotron-based grating interferometry setups. References and links1. U. Bonse and M. Hart, "An X-ray interferometer," Appl. Phys. Lett. 6, 155-156 (1965). 2. A. Momose, T. Takeda, Y. Itai, and K. Hirano, "Phase-contrast x-ray computed tomography for observing biological soft tissues," Nat. Med. 2, 473-475 (1996). 3. A. Yoneyama, T. Takeda, Y. Tsuchiya, J. Wu, T.-T. Lwin, A. Koizumi, K. Hyodo, and Y. Itai, "A phase-contrast X-ray imaging system-with a 60 x 30 mm field of view based on a skew-symmetric two-crystal X-ray interferometer," Nucl. Instrum. Methods Phys. Res. A 523, 217-222 (2004). 4. A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, "On the possibilities of x-ray phase contrast microimaging by coherent high-energy synchrotron radiation," Rev. Sci. Instrum. 66, 5486-5492 (1995). 5. P. Cloetens, R. Barrett, J. Baruchel, J.-P. Guigay, and M. Schlenker, "Phase objects in synchrotron radiation hard x-ray imaging," J.
The high photon flux and femtosecond pulse duration of hard X-ray free-electron lasers have spurred a large variety of novel and fascinating experiments in physical, chemical and biological sciences. many of these experiments depend fundamentally on a clean, welldefined wavefront. Here we explore the wavefront properties of hard X-ray free-electron laser radiation by means of a grating interferometer, from which we obtain shot-to-shot wavefront information with an excellent angular sensitivity on the order of ten nanoradian. The wavefront distortions introduced by optical elements are observed in-situ and under operational conditions. The source-point position and fluctuations are measured with unprecedented accuracy in longitudinal and lateral direction, both during nominal operation and as the X-ray free-electron laser is driven into saturation.
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