Yield enhancement in semiconductor fabrication is important. Even though IC yield loss may be attributed to many problems, the existence of defects on the wafer is one of the main causes. When the defects on the wafer form spatial patterns, it is usually a clue for the identification of equipment problems or process variations. This research intends to develop an intelligent system, which will recognize defect spatial patterns to aid in the diagnosis of failure causes. The neural-network architecture named adaptive resonance theory network 1 (ART1) was adopted for this purpose. Actual data obtained from a semiconductor manufacturing company in Taiwan were used in experiments with the proposed system. Comparison between ART1 and another unsupervised neural network, self-organizing map (SOM), was also conducted. The results show that ART1 architecture can recognize the similar defect spatial patterns more easily and correctly.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.