The short-circuit current density of a solar cell is used as a merit function to optimize solar cell antireflection coating designs. J(sc)/J(max) ratios reach 99%, even with a 10-nm-thick passivation layer.
An iterative algorithm has been developed that takes starting values derived by an envelope method but then minimizes the influence of the envelopes and emphasizes the actual measured data. This combination avoids the difficulties inherent in the accurate drawing of the envelopes and makes it possible to extract the thickness and the optical constants of semiconducting and dielectric films over a wide spectral region, including regions of high absorption.
Congruent vaporization is a process that yields constant vapor species. Ti(2)O(3) was continuously electron-beam evaporated to produce titanium oxide thin films. Rutherford backscattering spectrometry was employed to study the evolution of the composition of these films. It seems that congruent vaporization can be established in a coating plant. TiO(2) films produced by conventional reactive deposition tend to contain mixtures of titanium oxides. Increasing the transmission of TiO(2) films becomes an issue of increasing the TiO(2) component in the films by adequate reactive evaporation.
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