The growth behavior of amorphous anodic films\ud
on Ta–Nb solid solution alloys has been investigated over a\ud
wide composition range at a constant current density of\ud
50 Am−2 in 0.1 mol dm−3 ammonium pentaborate\ud
electrolyte. The anodic films consist of two layers,\ud
comprising a thin outer Nb2O5 layer and an inner layer\ud
consisting of units of Ta2O5 and Nb2O5. The outer Nb2O5\ud
layer is formed as a consequence of the faster outward\ud
migration of Nb5+ ions, compared with Ta5+ ions, during\ud
film growth under the high electric field. Their relative\ud
migration rates are independent of the alloy composition.\ud
The formation ratio, density, and capacitance of the films\ud
show a linear relation to the alloy composition. The\ud
susceptibility of the anodic films to field crystallization\ud
during anodizing at constant voltage increases with increasing\ud
niobium content of the alloy
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.