A fast and accurate birefringence measurement system has been built to study the in-plane birefringence of a rotating optical disk substrate. The fully automated instrument incorporates an axial Zeeman laser which emits both right and left hand circularly polarized lights, stationary polarization elements and a lock-in amplifier. Measurement results showing the accurate and fast features of the system are presented. It is also demonstrated that the in-plane birefringence mapping in rotating substrate of optical disk can be obtained by use of the ability of fast birefringence measurement.
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