Starting with the meaning of the word quality, diverse concepts connoted by the term are examined. Instead of a bathtub curve, the desirable shape of a failure rate covering the entire life of a good product, which might be called hockey-stick line, is introduced. From the hockey-stick line and the definition of reliability, two measurements are extracted. The terms r-reliability (failure rate) and durability (product life) are explained.The conceptual analysis of failure mechanics explains that reliability technology pertains to design area. The desirable shape of hazard rate curve of electronic items, hockey-stick line, clarifies that Mean-Time-to-failure (MTTF) as the inverse of failure rate can be regarded a nominal life. And Bx life, different from MTTF, is explained. Reliability relationships between components and set products are explained. Reshaped definitions of r-reliability and durability are recommended.The procedure to improve reliability and the reasons for failing to identify failure mode are clarified in order to search right solutions. And generalized Life-Stress failure model is recommended for the calculation of acceleration factor.
This paper proposes a way to predict electrical lifetime of a relay using Accelerated Life Testings (ALTs). The relay of interest mounting on printed circuit boards is usually under an inrush current stress. The inrush current is generated and accelerated through controlling a lamp switching device in the ALT. We find that the dominant failure mechanism under high levels of inrush current would be contact welding in the contact surface of the relay and the contact welding process is accelerated according to increase in inrush current. The electrical lifetime model based on Inverse Power Law in term of inrush current is proposed, and parameters characterizing relay's lifetime distribution are statistically estimated using ALTA 6 PRO software.
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