SUMMARYThis paper proposes a method which provides fast and precise evaluation of waveform degradation due to cross-phase modulation (XPM) in intensity modulation-direct detection systems with wavelength-division-multiplexing. The method consists of two corrections applied to the conventional method. The first is to take account of second-order self-phase modulation (SPM), which is induced by the waveform affected by XPM. The second is to take account of the higher-order Kerr effect. The proposed method requires only a single evaluation of an infinite integral, which can be performed in a shorter time than the SSF method. It is shown by comparison to the conventional method that very precise evaluation can be realized despite the simplicity.
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