The effect of accidental drops on MEMS sensors are examined within the framework of a multi-scale finite element approach. With specific reference to a polysilicon MEMS accelerometer supported by a naked die, the analysis is decoupled into macro-scale (at die length-scale) and meso-scale (at MEMS length-scale) simulations, accounting for the very small inertial contribution of the sensor to the overall dynamics of the device. Macro-scale analyses are adopted to get insights into the link between shock waves caused by the impact against a target surface and propagating inside the die, and the displacement/acceleration histories at the MEMS anchor points. Meso-scale analyses are adopted to detect the most stressed details of the sensor and to assess whether the impact can lead to possible localized failures. Numerical results show that the acceleration at sensor anchors cannot be considered an objective indicator for drop severity. Instead, accurate analyses at sensor level are necessary to establish how MEMS can fail because of drops.
Failure of packaged polysilicon micro-electro-mechanical systems (MEMS) subjected to impacts involves phenomena occurring at several length-scales. In this paper we present a multi-scale finite element approach to properly allow for: (i) the propagation of stress waves inside the package; (ii) the dynamics of the whole MEMS; (iii) the spreading of micro-cracking in the failing part(s) of the sensor. Through Monte Carlo simulations, some effects of polysilicon micro-structure on the failure mode are elucidated.
A new out-of-plane resonant micro-machined accelerometer has been designed, modelled and fabricated. The sensing principle is based on the variation of the electrostatic stiffness of two torsional\ud
resonators mechanically coupled with an inertial proof mass. The accelerometer, fabricated by the ThELMA® surface micro-machining process of STMicroelectronics, constitutes a further step of a research focussing on the design of in-plane and out-of-plane resonant micro accelerometers. Preliminary electrostatic measures of the torsional resonators response
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