We report on III-nitride photovoltaic cells with external quantum efficiency as high as 63%. InxGa1−xN/GaN p-i-n double heterojunction solar cells are grown by metal-organic chemical vapor deposition on (0001) sapphire substrates with xIn=12%. A reciprocal space map of the epitaxial structure showed that the InGaN was coherently strained to the GaN buffer. The solar cells have a fill factor of 75%, short circuit current density of 4.2 mA/cm2, and open circuit voltage of 1.81 V under concentrated AM0 illumination. It was observed that the external quantum efficiency can be improved by optimizing the top contact grid.

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High internal and external quantum efficiency GaN/InGaN solar cells are demonstrated. The internal quantum efficiency was assessed through the combination of absorption and external quantum efficiency measurements. The measured internal quantum efficiency, as high as 97%, revealed an efficient conversion of absorbed photons into electrons and holes and an efficient transport of these carriers outside the device. Improved light incoupling into the solar cells was achieved by texturing the surface. A peak external quantum efficiency of 72%, a fill factor of 79%, a short-circuit current density of 1.06 mA/cm2, and an open circuit voltage of 1.89 V were achieved under 1 sun air-mass 1.5 global spectrum illumination conditions.

We demonstrate high quantum efficiency InGaN/GaN multiple quantum well (QW) solar cells with spectral response extending out to 520 nm. Increasing the number of QWs in the active region did not reduce the carrier collection efficiency for devices with 10, 20, and 30 QWs. Solar cells with 30 QWs and an intentionally roughened p-GaN surface exhibited a peak external quantum efficiency (EQE) of 70.9% at 390 nm, an EQE of 39.0% at 450 nm, an open circuit voltage of 1.93 V, and a short circuit current density of 2.53 mA/cm2 under 1.2 suns AM1.5G equivalent illumination.

High external quantum efficiency (EQE) p-i-n heterojunction solar cells grown by NH3-based molecular beam epitaxy are presented. EQE values including optical losses are greater than 50% with fill-factors over 72% when illuminated with a 1 sun AM0 spectrum. Optical absorption measurements in conjunction with EQE measurements indicate an internal quantum efficiency greater than 90% for the InGaN absorbing layer. By adjusting the thickness of the top p-type GaN window contact layer, it is shown that the short-wavelength (<365 nm) quantum efficiency is limited by the minority carrier diffusion length in highly Mg-doped p-GaN.

A two-step GaN barrier growth methodology was developed for InxGa1−xN/GaN multiple quantum well solar cells in which a lower temperature GaN cap layer was grown on top of the quantum wells (QWs) and then followed by a higher temperature GaN barrier layer. The performance of the solar cells improved markedly by increasing the low temperature GaN cap layer thickness from 1.5 to 3.0 nm. High-angle annular dark field scanning transmission electron microscopy and atom probe tomography measurements showed that increasing the GaN cap layer thickness improved the uniformity and increased the average indium content of the QWs.

The effect of doping and polarization on carrier collection is investigated for InGaN quantum well solar cells. Energy band diagram simulations of actual devices indicate that spontaneous and piezoelectric polarization sheet charges can inhibit carrier collection unless these charges are screened by sufficient doping. By increasing the doping on both sides of the active region, the polarization-induced barriers to carrier collection were eliminated and the short circuit current density was increased from 0.1 to 1.32 mA/cm2 under 1.5 sun AM1.5G equivalent illumination, leading to devices with an open circuit voltage of 1.9 V and a fill factor of 71%.

Optical and electrical characteristics of InGaN/GaN quantum-well (QW) light-emitting diodes (LEDs) are the subjects of this study. Samples were prepared on nonpolar (1 0   0) and semipolar (1 1   2) orientations of bulk GaN substrates. Electrical-bias-applied photoluminescence was employed as a characterization technique. It was confirmed that saturation of reverse photocurrent occurred around 0 V in nonpolar LEDs and at positive voltages in (1 1   2)-oriented LEDs, while our previous study found negative voltages in (0 0 0 1)-oriented LEDs (Masui et al 2008 J. Phys. D: Appl. Phys. 41 165105). These results indicated that (1 1   2)-oriented InGaN/GaN QWs experience piezoelectric fields being in the same direction as the built-in field. Piezoelectric field intensity was estimated to be −0.3 MV cm−1 in the (1 1   2)-oriented QW structure. Spectral comparison between photoluminescence and electroluminescence of the LED samples exhibited a tendency that spectral differences were insignificant in single-QW LEDs.