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We demonstrate the development of a simply equipped displacement sensor utilizing spatially dispersive confocal technology. It feeds the amplified spontaneous emission (ASE) of a laser diode to a wavelength-selective feedback structure that corresponds to the position of a measured surface. The displacement sensor has a detecting range of 4 microm and precision of less than 2 nm, as proven by the analysis of the spectral shifts of the multipassed amplified output ASE. As compared with traditional sensors, the displacement sensor presented in our study requires fewer components and has as high precision as complex systems and a higher measurement rate due to the simpler strategy of displacement determination.

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We present a demonstration and analysis of an industrialized design of a spatially dispersive displacement sensor, which is composed of an AlGaInP gain chip in visible range, optical assembly, and a spectrum analyzer. The sensor utilizes the spatial dispersion of focus from the optical assembly and wavelength spectrum's deviation induced by the displacement of the target. As a result, the sensor delivers a quick and simple way of measuring displacement. By adapting the magnification and resolution of the optical assembly, a displacement sensor with a middle measurement range, ~10 microm, was obtained. However, we should note that 25 nm resolution is limited by the bandwidth and temperature fluctuation of the gain chip.

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