Undesired growth of biofilms represents a fundamental problem for all surfaces in long-term contact with aqueous media. Mature biofilms resist most biocide treatments and often are a pathogenic threat. One way to prevent biofilm growth on surfaces is by using slippery liquid-infused porous surfaces (SLIPS). SLIPS consist of a porous substrate which is infused with a lubricant immiscible with the aqueous medium in which the bacteria are suspended. Because of the lubricant, bacteria cannot attach to the substrate surface and thus formation of the biofilm is prevented. For this purpose, we manufactured substrates with different porosity and surface roughness values via UVinitiated free-radical polymerization in Fluoropor. Fluoropor is a class of highly fluorinated bulk-porous polymers with tunable porosity, which we recently introduced. We investigated the growth of the biofilm on the substrates, showing that a reduced surface roughness is beneficial for the reduction of biofilm growth. Samples of low roughness effectively reduced Pseudomonas aeruginosa biofilm growth for 7 days in a flow chamber experiment. The lowroughness samples also become transparent when infused with the lubricant, making such surfaces ideal for real-time observation of biofilm growth by optical examination.
Properties of stacked SrTiO3/Al2O3 metal-insulator-metal capacitorsTwo-dimensional (2D) superconductivity is observed between insulating amorphous Al 2 O 3 and TiO 2 -terminated (001)-oriented SrTiO 3 . The heterostructure displays interfacial metallic conduction from room temperature down to %200 mK where superconductivity sets in. The voltage-current V(I) characteristics indicate a power-law scaling behavior V / I a with a temperature dependent exponent a, indicative for a Berezinskii-Kosterlitz-Thouless transition at T BKT % 160 mK and a 2D superconducting state. The superconducting transition was found to be very sensitive to a magnetic field B. V C 2014 AIP Publishing LLC. [http://dx.
In this work we experimentally and theoretically analyze the detachment of microscopic polystyrene beads from different self-assembled monolayer (SAM) surfaces in a shear flow in order to develop a mechanistic model for the removal of cells from surfaces. The detachment of the beads from the surface is treated as a thermally activated process applying an Arrhenius Ansatz to determine the activation barrier and attempt frequency of the rate determing step in bead removal. The statistical analysis of the experimental shear detachment data obtained in phosphate-buffered saline buffer results in an activation energy around 20 kJ/mol, which is orders of magnitude lower than the adhesion energy measured by atomic force microscopy (AFM). The same order of magnitude for the adhesion energy measured by AFM is derived from ab initio calculations of the van der Waals interaction energy between the polystyrene beads and the SAM-covered gold surface. We conclude that the rate determing step for detachment of the beads is the initiation of rolling on the surface (overcoming static friction) and not physical detachment, i.e., lifting the particle off the surface.
The thickness measurement of transparent layers with optical techniques is very problematic. The observed deviations can easily reach 100% of the layer thickness to be measured. In order to analyse these deviations, tactile reference measurements have been developed. The proposed method is based on contact mode measurements with low contact pressure. With stylus instruments, this can be realized either by using the recommended tip radius of 2 µm and very small probing forces in the micronewton range (and low scanning speeds of 50 µm s−1) or by using the recommended probing force of 750 µN, but a large probing tip radius. Three metal layers on silicon or silicon dioxide and two polymer resist materials on a thin chromium adhesive layer on silicon are used as artefacts. The comparison of the optical measurements with the tactile reference values disclosed deviations of the optical measurements of up to 195% of the layer thickness. Layer thicknesses were between 200 nm and 4 µm. This paper analyses the deviations of two white light interference microscopes, one phase shift interference microscope, one confocal microscope, one autofocus sensor, a chromatic sensor, an interferometric film thickness sensor and one spectroscopic ellipsometer. Simple and well-known expressions for the description of the observed deviations are presented and discussed. The order of magnitude of the observed deviations can be described well by these correction formulas but further investigations are necessary in order to better understand the systematic deviations of optical surface measuring instruments on non-cooperating surfaces.
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