The increase in sheet resistance of indium–tin–oxide (ITO) films on polyethylene terephthalate with increasing tensile strain is reported. The increase in resistance is related to the number of cracks in the conducting layer which depends upon applied strain and film thickness. We propose a simple model that describes the finite but increasing resistance in the cracked ITO layer in terms of a small volume of conducting material within each crack.
Semi-interpenetrating polymer networks (semi-IPNs) containing poly(ethylene glycol)-diacrylate (PEGdA) and modified gelatin were prepared with 2,2-dimethoxy-2-phenylacetophenone (DMPA) as a photoinitiator. The effect of (i) initiator and PEGdA concentration, and (ii) weight ratio and type of modified gelatin on the conversion of PEGdA functional end groups was monitored in situ using attenuated total reflectance-Fourier transform infrared (ATR-FTIR). Reaction induction time was dependent on DMPA concentration and increased with decreasing DMPA concentration. Relative reaction rate was strongly dependent on both DMPA and PEGdA concentrations. Gelatin weight ratio and modification did not significantly affect reaction induction time, relative reaction rate, or reaction end time. Swelling/degradation kinetics at various aqueous conditions sought to establish relationships between diacrylate conversion and the resulting semi-IPN physical properties. Semi-IPN swelling weight ratio was strongly dependent on solvent conditions and semi-IPN exposure to gamma-irradiation. Gelatin backbone modification and UV exposure time exhibited no effect on semi-IPN swelling weight ratio. In conclusion, ATR-FTIR presents a viable means of monitoring the conversion of PEGdA functional end groups within a complex mixture. UV exposure >10 s did not significantly affect the weight swelling ratio, and supports our ATR-FTIR results that network formation reached completion before 3 min of UV exposure.
We report on the change in electrical resistance of tin doped indium oxide thin films on polymer substrates with increasing uniaxial strain. The resistance increases rapidly but continuously above a threshold strain. The threshold strain at which the resistance increases is correlated to the onset of cracking in the oxide film. The strain for cracking and increase in resistance depend upon film thickness. We have measured the distance between neighboring ITO cracks as a function of strain in situ using an optical microscope. At high uniaxial strains the ITO layer fails in the orthogonal direction due to lateral contraction of the polymer substrate. The gradual increase in resistance is modeled assuming there is a conducting layer at the polymer/ITO interface.
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