Ceria and its solid solutions play a vital role in several industrial processes and devices. These include solar energy-to-fuel conversion, solid oxide fuel and electrolyzer cells, memristors, chemical looping combustion, automotive 3-way catalysts, catalytic surface coatings, supercapacitors and recently, electrostrictive devices. An attractive feature of ceria is the possibility of tuning defect-chemistry to increase the effectiveness of the materials in application areas. Years of study have revealed many features of the long-range, macroscopic characteristics of ceria and its derivatives. In this review we focus on an area of ceria defect chemistry which has received comparatively little attention -defect-induced local distortions and short-range associates. These features are non-periodic in nature and hence not readily detected by conventional X-ray powder diffraction. We compile the relevant literature data obtained by thermodynamic analysis, Raman spectroscopy, and X-ray absorption fine structure (XAFS) spectroscopy. Each of these techniques provides insight into material behavior without reliance on longrange periodic symmetry. From thermodynamic analyses, association of defects is inferred. From XAFS, an element-specific probe, local structure around selected atomic species is obtained, whereas from Raman spectroscopy, local symmetry breaking and vibrational changes in bonding patterns is detected.We note that, for undoped ceria and its solid solutions, the relationship between short range order and cation-oxygen-vacancy coordination remains a subject of active debate. Beyond collating the sometimes contradictory data in the literature, we strengthen this review by reporting new spectroscopy results and analysis. We contribute to this debate by introducing additional data and analysis, with the expectation that increasing our fundamental understanding of this relationship will lead to an ability to predict and tailor the defect-chemistry of ceria-based materials for practical applications. monoxide, and NO x from the exhaust stream, precise control of the oxygen-to-fuel ratio is necessary. Ceria has the capacity to serve as an oxygen buffer by actively varying its oxygen nonstoichiometry, supplying oxygen when required for carbon oxidation, and removing it as necessary for NO x reduction. Another promising use of the oxygen storage capacity of ceria is in solar-driven thermochemical water splitting. 15,16 During this cyclic process, ceria releases oxygen at extremely high temperatures (typ. 1500 1C), which can be achieved by solar concentration. Subsequently, the material is cooled to 800-1000 1C, and the oxygen vacancies generated from the prior reduction step are filled with oxygen through a water and CO 2 splitting reaction. Though not treated in this review, it is noteworthy that doping with tetravalent cations, Zr 4+ or Hf 4+ , increases the ease by which the reduction of the host material occurs. 17,18 This behavior is used to increase the oxygen storage capacity in exhaust catalysts, or to decrea...

Roll-to-roll manufacturing of CdTe solar cells on flexible metal foil substrates is one of the most attractive options for low-cost photovoltaic module production. However, various efforts to grow CdTe solar cells on metal foil have resulted in low efficiencies. This is caused by the fact that the conventional device structure must be inverted, which imposes severe restrictions on device processing and consequently limits the electronic quality of the CdTe layer. Here we introduce an innovative concept for the controlled doping of the CdTe layer in the inverted device structure by means of evaporation of sub-monolayer amounts of Cu and subsequent annealing, which enables breakthrough efficiencies up to 13.6%. For the first time, CdTe solar cells on metal foil exceed the 10% efficiency threshold for industrialization. The controlled doping of CdTe with Cu leads to increased hole density, enhanced carrier lifetime and improved carrier collection in the solar cell. Our results offer new research directions for solving persistent challenges of CdTe photovoltaics.

Oxide-based valence-change memristors are promising nonvolatile memories for future electronics that operate on valence-change reactions to modulate their electrical resistance. The memristance is associated with the movement of oxygen ionic carriers through oxygen vacancies at high electric field strength via structural defect modifications that are still poorly understood. This study employs a CeGdO solid solution model to probe the role of oxygen vacancies either set as "free" or as "immobile and clustered" for the resistive switching performance. The experiments, together with the defect chemical model, show that when the vacancies are set as "free", a maximum in memristance is found for 20 mol % of GdO doping, which clearly coincides with the maximum in ionic conductivity. In contrast, for higher gadolinia concentration, the oxide exhibits only minor memristance, which originates from the decrease in structural symmetry, leading to the formation of "immobile" oxygen defect clusters, thereby reducing the density of mobile ionic carriers available for resistive switching. The research demonstrates guidelines for engineering of the oxide's solid solution series to set the configuration of its oxygen vacancy defects and their mobility to tune the resistive switching for nonvolatile memory and logic applications.

Resistive switches based on anionic electronic conducting oxides are promising devices to replace transistor-based memories due to their excellent scalability and low power consumption. In this study, we create a model switching system by manufacturing resistive switches based on ultrathin 5 nm, epitaxial, and grain boundary-free strontium titanate thin films with subnanometer surface roughness. For our model devices, we unveil two competing nonvolatile resistive switching processes being of different polarities: one switching in clockwise and the other in counterclockwise direction. They can be activated selectively with respect to the effective switching voltage and time applied to the device. Combined analysis of both processes with electrical DC-methods and electrochemical impedance spectroscopy reveals that the first resistive switching process is filament-based and exhibits counterclockwise bipolar resistive switching. The R(OFF)/R(ON) resistance ratio of this process is extremely stable and can be tuned in the range 5-25 depending on the switching voltage and time. Excitingly, at high electric field strength a second bipolar resistive switching process was found. This process is clockwise and, therefore, reveals the opposite polarity switching direction when compared to the first one. Both processes do not obstruct each other, consequently, stable 1, 2, or even 3 crossover current-voltage (I-V) characteristics can be addressed for the memory bits. Equivalent circuit model analysis and fitting of impedance characteristics unequivocally show for the created grain boundary free switches that the oxide's defects and its carrier distribution close to the electrode interface contribute to the resistive switching mechanism. The addressability of two sets of resistive ON and OFF states in one device through electric field strength and switching time offers exciting new operation schemes for memory devices.

Memristive devices based on mixed ionic–electronic resistive switches have an enormous potential to replace today's transistor‐based memories and Von Neumann computing architectures thanks to their ability for nonvolatile information storage and neuromorphic computing. It still remains unclear however how ionic carriers are propagated in amorphous oxide films at high local electric fields. By using memristive model devices based on LaFeO3 with either amorphous or epitaxial nanostructures, we engineer the structural local bonding units and increase the oxygen‐ionic diffusion coefficient by one order of magnitude for the amorphous oxide, affecting the resistive switching operation. We show that only devices based on amorphous LaFeO3 films reveal memristive behavior due to their increased oxygen vacancy concentration. We achieved stable resistive switching with switching times down to microseconds and confirm that it is predominantly the oxygen‐ionic diffusion character and not electronic defect state changes that modulate the resistive switching device response. Ultimately, these results show that the local arrangement of structural bonding units in amorphous perovskite films at room temperature can be used to largely tune the oxygen vacancy (defect) kinetics for resistive switches (memristors) that are both theoretically challenging to predict and promising for future memory and neuromorphic computing applications.