Rare earth compounds are interesting from both a theoretical point of view and for their applications. That is the reason why determining their optical and electrical properties deserves special attention. In this article, we present the conditions we obtained homogenous CeNi5 thin films of nanometer thicknesses. To achieve this goal, our method of choice was laser-induced vaporization, using short and modulated impulses, with electro-optical tuning for the quality factor. The layers that were deposited at a single laser burst had thicknesses between 1.5 and 2.5 nm, depending on the geometry of the experimental setup.Structural and compositional studies of the nanoscale films were made using XRD. The temperature dependence of electrical conductivity was also determined. The following optical properties of the specimens were computed using the Kramers-Krönig framework and discussed: absolute reflection and transmission coefficients for a single wavelength and relative ones for the wide UV-VIS-IR spectra, spectral dependence of the refractive index, and extinction coefficient as real and imaginary parts of the complex refractive index. The valence band studies were made with X-ray photoelectron spectroscopy. All these determinations were well correlated and permitted the evaluation of the energy densities of states in the deeper bands, near the Fermi energy, and at the surface states.

Small-angle scattering (of neutrons, x-ray, or light; SAS) is considered to describe the structural characteristics of deterministic nanoscale fat fractals. We show that in the case of a polydisperse fractal system, with equal probability for any orientation, one obtains the fractal dimensions and scaling factors at each structural level. This is in agreement with general results deduced in the context of small-angle scattering analysis of a system of randomly oriented, non-interacting, nano-/micro-fractals. We apply our results to a two-dimensional fat Cantor-like fractal, calculating analytic expressions for the scattering intensities and structure factors. We explain how the structural properties can be computed from experimental data and show their correlation to the variation of the scaling factor with the iteration number. The model can be used to interpret recorded experimental SAS data in the framework of fat fractals and can reveal structural properties of materials characterized by a regular law of changing of the fractal dimensions. It can describe successions of power-law decays, with arbitrary decreasing values of the scattering exponents, and interleaved by regions of constant intensity.

Deterministic nano-fractal structures have recently emerged, displaying huge potential for the fabrication of complex materials with predefined physical properties and functionalities. Exploiting the structural properties of fractals, such as symmetry and self-similarity, could greatly extend the applicability of such materials. Analyses of small-angle scattering (SAS) curves from deterministic fractal models with a single scaling factor have allowed the obtaining of valuable fractal properties but they are insufficient to describe non-uniform structures with rich scaling properties such as fractals with multiple scaling factors. To extract additional information about this class of fractal structures we performed an analysis of multifractal spectra and SAS intensity of a representative fractal model with two scaling factors-termed Vicsek-like fractal. We observed that the box-counting fractal dimension in multifractal spectra coincide with the scattering exponent of SAS curves in mass-fractal regions. Our analyses further revealed transitions from heterogeneous to homogeneous structures accompanied by changes from short to long-range mass-fractal regions. These transitions are explained in terms of the relative values of the scaling factors.

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This work presents pulsed laser deposition as a method to obtain unoxidized LaNi5 nanoscale films and describes their temperature and thickness dependent electrical conductivity and the spectral dispersions of some optical properties. AB5-type rare earth element (REE)-nickel compounds are currently studied from both theoretical and practical points of view. Special challenges are posed during the preparation of these nanomaterials, which can be overcome using finely tuned parameters in a preparation process that always involves the use of high energies. Film deposition was made by laser—induced vaporization, with short and modulated impulses and electro–optical tuning of the quality factor, mainly on glass and one SiO2 substrate. Deposition geometry dependent linear thickness increase, between 1.5–2.5 nm per laser burst, was achieved. Film structures and phase compositions were determined using XRD and discussed in comparison with films obtained by similar deposition procedures. Temperature and scale dependent properties were determined by studying electrical conductivity and optical properties. Electrical conductivity was measured using the four-probe method. The observed semiconductor-like conductivity for film thicknesses up to 110 nm can be explained by thermal activation of electrons followed by inter-insular hopping or quantum tunneling, which, on the other hand, modulates the material’s native metallic conductance. Films with thicknesses above this value can be considered essentially metallic and bulk-like. The spectral behaviors of the refractive index and absorption coefficient were deduced from differential reflectance spectroscopy data acquired on a broad ultraviolet, visible, near- and mid-infrared (UV-VIS-NIR-MIR) domain, processed using the Kramers-Krönig formalism. Their study led to the identification of the allowed interband transitions. Electronic behavior in the energy bands near the Fermi level and in the surface and interface-states was described, discussing the differences between experimental data and the classical free-electron theoretical model applied for the bulk intermetallic alloy, in correlation with theoretical optical properties or experimental X-ray photoelectron spectroscopy (XPS) results from references. However, the dielectric-like shape of the reflectance of the thinnest film was in accordance with the Lorentz–Drude model.