Although the hard magnetic SmCo5 phase has very attractive and well-known intrinsic magnetic properties, it has not been grown as an epitaxial thin film, so far. This letter reports the epitaxial growth of SmCo5 films by pulsed-laser deposition on Cr(100) buffered MgO(100) single-crystal substrates. The phase purity, crystal structure, epitaxial relation to the substrate, and magnetic properties have been determined by careful energy-dispersive x-ray analysis, pole figure measurements, transmission electron microscopy, and vibrating sample magnetometry. Compared to the formerly studied Sm2Co7 films, the preparation of the SmCo5 phase improves the remanent magnetization by 38%.
Diffraction with high-energy synchrotron radiation is a new experimental method to determine textures of materials, which due to the special properties of this radiation, in the future may have advantages in terms of accuracy of local texture measurements in comparison to established methods like Electron back scatter diffraction (EBSD). In the present study NiAl polycrystals with two different initial textures have been deformed in torsion at 727 C and 1000 C and their texture development has been measured with highenergy synchrotron radiation. Torsion enables the study of texture formation with strain as well as the exploration of large strains without changing the shape of the samples. The pole figures indicate the preferred alignment of h100i with the shear direction and {110} with the shear plane. High pressure torsion may also open new possibilities in terms of grain refinement and texture formation and thus ductilization of NiAl.
Hard magnetic materials with a uniaxial magnetocrystalline anisotropy can be most efficiently used if the easy axis is well aligned along one crystallographic direction in the entire sample volume. Epitaxial growth is one suitable method to achieve this aim and therefore Sm–Co thin films on Cr-buffered single-crystal MgO (100) substrates were deposited. Pulsed laser deposition from elemental Sm and Co targets was used to prepare films of nominal Sm2Co7 stoichiometry. Pole figure measurements and magnetization measurements reveal an epitaxial growth of Cr on MgO onto which the c axis of the Sm–Co layer is aligned in plane, viz., MgO(001)[100]‖Cr(001)[110]‖Sm–Co(110)[001]. At higher deposition temperatures an additional Sm–Co (1 1 16) texture was observed. This corresponds to an additional epitaxial orientation relation, where the c axis is tilted 60° out of the substrate plane. However, at low deposition temperatures and with smaller pulse repetition rates a reduction in the amount of this unwanted component can be achieved. This leads to the orientation of the c axis, which is the easy magnetization axis, only along two equivalent MgO [100] directions in the substrate plane. The resulting magnetic anisotropy has been confirmed by hysteresis measurements along three nonequivalent directions where high remanences and a high coercivity of up to 2.4T along MgO [110] can be achieved.
Hard magnetic Sm-Co thin films were prepared on Cr buffered MgO(001) single crystals by pulsed laser deposition. The texture of the films as well as the magnetic properties were measured for films deposited at different temperatures. Sm-Co is a system with high uniaxial magnetic anisotropy, where the c-axis is the axis of easy magnetization. Thin films of this material, with high coercivity and remanence, are of increasing interest for application in magnetic miniature devices. To explore the potential of this permanent magnetic material, a strong texture with a wellaligned c-axis is required. Analysis of several pole figures shows that mainly two types of orientations develop which grow epitaxially on Cr. For one orientation, the c-axis lies n the sample surface parallel to Cr(110). The c-axis of the second orientiation is tilted by 60° out of the surface plane.
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