In this study, polyvinylidene fluoride (PVDF) thick films with thickness ∼180 µm were synthesized by solution casting. X-ray diffraction study established the co-existence of both α and β-phases. Raman spectroscopy of the synthesized PVDF thick films corroborated the existence of α and β-phases in 0.71:1 ratio. Surface micrographs of PVDF thick films showed dense microstructure with grain size ∼10 µm. Additionally, the room temperature values of dielectric constant and dielectric loss at 100 kHz were measured to be ∼20 and 0.33, respectively. Furthermore, ferroelectric behavior of PVDF thick films was confirmed by the polarization versus electric field (P–E) hysteresis loop study. A leakage current density of 1.55 × 10−5 A cm−2 at an applied electric field of 500 kV cm−1 was obtained in PVDF thick films.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.