This paper describes a new testing technique for tape-automated-bonding (TAB)-bonded LSIs operating in the gigahertz-frequency range.A TAB tape is sandwiched between test tools in order to compose a stripline configuration during testing. This new technique enables the testing frequency range to be dramatically extended by reducing reflection noise caused by impedance mismatch between the test leads and the test sets. Maximum testing bit rate reaches 5 Gbit/s, which is 2.5 times greater than the conventional technique.
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