CCD sensors are able to image a few megapixels within one frame. The image is scanned electronically within the semiconductor chip (instead of mechanical-optical scanning with moving mirrors, Nipkow discs or acousto-optical devices). Through parallelization. the novel concept yields speed at an unprecedented degree for confocal imaging Routine applications requiring high speed and low costs will profit from this principle. Thus, confocal imaging technology will take the same path television technology has taken—from mechanical scanning to the broadest possible application of electronicsIn order to go this way, a pinhole matrix is used on the illumination side. It has as many pinholes and the same pitch as the pitch and number of pixels of the CCD (Figure 1). In front of the receiver, a second pinhole matrix with the same pitch and number of pinholes is used All pinholes of both matrices and the pixels of the CCD are in confocal position.
Schlagwörter: Bildverarbeitung, Lagevermessung, Korrelation, Eigenwertzerlegung, Singular Value Decomposition Der Aufsatz beschreibt die Lageschätzung von Objekten in Bildern unter Einsatz der Korrelation und Eigenwertzerlegung (Singular Value Decomposition, SVD). Die Korrelation ist bei Annahme von weißem Rauschen als optimale Methode für die Lageschätzung lange bekannt, scheitert aber in der Praxis häufig an dem sehr hohen Rechenaufwand. Die SVD bietet nun die Möglichkeit, den Rechenaufwand wesentlich zu senken, wobei kein systematischer Fehler entsteht und die Schätzvarianz im allgemeinen nur unwesentlich ansteigt. Simulationen und Messungen an realen Objekten bestätigen diese Aussage.The paper describes the position estimation of objects in images using correlation and singular value decomposition (SVD). The correlation is well known as an optimal method for position estimation in the presence of white noise, however in practice the method is often discarded by the high computational burden. The SVD allows to reduce this computational burden considerabely without introducing any systematic error and typically only with a small degradation of the estimation variance. These features are prooven by simulations and real object measurements.
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