This dissertation has been submitted in partial fulfillment of requirements for an advanced degree at The University of Arizona and is deposited in the University Library to be made available to borrowers under rules of the Library. Brief quotations from this dissertation are allow able without special permission, provided that accurate acknowledgment of source is made. Requests for permission for extended quotation from or reproduction of this manu script in whole or in part may be granted by the head of the major department or the Dean of the Graduate College when in his judgment the proposed use of the material is in the interests of scholarship. In all other instances, however, permission must be obtained from the author. ACKNOWLEDGMENTS The author wishes to thank Professor C. T. Tomizuka for his guidance and encouragement throughout this research project, Mr. Rodney C. Lowell for his contributions in setting up the high pressure laboratory and for operating the high pressure apparatus, Dr. E. Daniel Albrecht for his contributions in designing much of the apparatus used in the course of this research, and Mr. Donald E. McDonald for his assistance with the electrical and electronic apparatus. The early stages of this research project were sponsored by the U. S. Air Force Office of Scientific Research through Contract No. AF 49(638)-790, and the later stages by the U. S. Atomic Energy Commission through Contract No. AT(ll-l)-1041. The support of these agencies is gratefully acknowl edged. lii
The mean atom drift for Ag and Au tracers, placed at the interface of AgAu alloy diffusion couples, has been measured over composition ranges for which the diffusion coefficient gradient is very small. By using large diffusion penetrations and temperatures at which the jump frequency ratio for the two species is large, the tracer shifts were determined sufficiently accurately to confirm the LeClaire and Manning theories of vacancy kinetics in non‐dilute alloys. An alternative approach, “diffusion‐coefficient analysis”, proved to be less reliable.
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