Using an existential perspective, world views of White Americans, mainland Chinese, Taiwanese, and Africans were investigated. Mainland Chinese, Taiwanese, and African international students differed from White American students in perceiving human relationships as lineal-hierarchical and collateral-mutual, human nature as evil, nature as controllable, and the doing modality as valuable. White Americans gave primacy to individual goals in interpersonal relationships and preferred the being modality. Some international students' world views were also different from traditional values of their respective cultures, reflecting possibly the changing perceptions of modernizing societies with changing political situations. Suggestions are made for a modernization model of world views across cultures. Implications for applied psychology are discussed.
The types of error produced by beam deviation in the optical elements of an ellipsometer are examined. It is shown that there are two types of error that may be significant-systematic errors due to a variation in the plane of incidence and in the angle of incidence at the specimen and errors due to the combined effects of beam displacement and nonuniformities in either the detector response or the optical properties of the specimen, the compensator, the polarizer, the analyzer, or the specimen cell. Analytic expressions for the variation in the plane of incidence and in the angle of incidence are given in terms of parameters that can be determined experimentally. A method by which these parameters can be measured is described. It is shown that the azimuthal variation in the angle of incidence produces fundamental errors in conventional zone averaging techniques because the values of psi and Delta are averaged at different angles of incidence in different zones. Methods of experimentally predetermining when such errors are likely to be significant are discussed, and a procedure that cancels most systematic errors due to beam deviation in each zone is described. The combined effects of beam deviation in the polarizer, the compensator, the cell windows, and the analyzer are considered in several commonly used configurations, and the configurations that minimize beam deviation errors are described.
Beam deviation in the polarizing elements is identified as a significant source of error in existing ellipsometer alignment procedures. A high precision alignment procedure that eliminates these errors is described. This procedure is less time consuming than previous methods, and its accuracy is comparable to the limit of resolution of the ellipsometer (typically 0.01-0.005 degrees ). A further advantage of this procedure is that it provides a precise method for the alignment of specimens and lasers with the ellipsometer.
Formulas by which the partial derivatives of the ellipsometric parameters psi and Delta with respect to the angle of incidence can be calculated are presented. These derivatives are plotted as a function of the angle of incidence, the refractive indices of the film, the substrate, and the immersion medium, and also as a function of film thickness on three-dimensional graphs. These graphs illustrate the angular regions in which angle-of-incidence errors are significant for typical materials. At the angles of incidence at which these derivatives are large, errors due to beam deviation and errors due to the use of noncollimated light or due to the use of specimens with rough or irregular surfaces can be significant. The results illustrate that the errors due to beam deviation are often significant in zone-averaged measurements when standard optical components with wedge angle tolerances of 0 degrees 3' of arc are used.
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