This paper describes a core-based test and diagnosis integration and automation system, called Turbo1500, which automatically synthesizes test and diagnosis logic in accordance with the IEEE 1500 standard. Turbo1500 serves two major purposes. One is for use as a core test automation tool
in a system-on-chip (SOC) environment to automatically connect multiple cores from various sources and create testbenches each targeting an individual core under the control of a chip-level test access port (TAP) controller. The other is for hierarchical (block-by-block) core test and diagnosis when chips on a printed-circuit board are embedded with 1149.1 boundary scan I/O cells and cores under test and diagnosis are surrounded with 1500-compliant wrapper cells. Application experienceshowed that the simplicity of the IEEE 1500 standard combined with an easy-to-use automation tool can make core-based design for test and diagnosis no longer a nightmare, especially when some cores are extremely large or complex.
The main aim of the present study was to examine and explore the family environment and perceived stress amongst working and non-working women. A sample of 60 women (30 working women and 30 homemakers) was drawn from the population. The purposive sampling technique was used. Family Environment Scale by Dr. Harpreet Bhatia and Dr. N.K.Chadha and Perceived Stress Scale by Cohen, Kamarck, and Mermelstein were used for data collection. Mean, Standard Deviation, t-test, and Correlation were the statistics calculated. Results indicated that there was no significant difference between perceived stress and family environment among working and non-working women. Results revealed that working women and homemakers equally experience the perceived stress on a daily basis which has direct or indirect effects on the family environment between both the groups.
This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered single-capture scheme followed by the one-hot single-capture scheme for detecting structural faults, which are neither timing-dependent nor sequence-dependent in a scan design. Structural faults are also called combinational faults or DC faults, such as stuck-at faults and bridging faults. Typically, the one-hot scheme achieves near maximum fault coverage, takes shorter ATPG run time, but produces a large pattern count, whereas the staggered scheme produces smaller pattern count but needs long ATPG run time and may suffer from some fault coverage loss. The proposed hybrid technique is intended to optimize fault coverage with respect to the one-hot scheme by exploring trade-offs between pattern count and ATPG run time of multimillion-gate scan designs. Experimental results show that the proposed hybrid technique can achieve higher fault coverage and up to 4X smaller pattern count than the one-hot scheme.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.