A high-dynamic range RF RMS detector with 1 GHz bandwidth based on the dynamic translinear principle and integrated in a BiCMOS process is presented. The main computation is carried out in the current domain and errors due to finite transistor gain are compensated in a novel structure. To make the circuit suitable for voltage processing, both input and output interface circuits are included. Measurements on a prototype chip demonstrate the practicality of the circuit for on-chip embedded tests.
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