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Liquid-phase electron microscopy (LPEM) is capable of imaging nanostructures and processes in a liquid environment. The spatial resolution achieved with LPEM critically depends on the thickness of the liquid layer surrounding the object of interest. An excessively thick liquid results in broadening of the electron beam and a high background signal that decreases the resolution and contrast of the object in an image. The liquid thickness in a standard liquid cell, consisting of two liquid enclosing membranes separated by spacers, is mainly defined by the deformation of the SiN membrane windows toward the vacuum side, and the effective thickness may differ from the spacer height. Here, we present a method involving a pressure controller setup to balance the pressure difference over the membrane windows, thus manipulating the shape profiles of the used silicon nitride membrane windows. Electron energy loss spectroscopy (EELS) measurements to determine the liquid thickness showed that it is possible to control the thickness precisely during an LPEM experiment by regulating the interior pressure of the liquid cell. We demonstrated atomic resolution on gold nanoparticles and the phase contrast using silica nanoparticles in liquid with controlled thickness.

A Co-Ce catalyst permits the hydrodeoxygenation of alcohols, aldehydes, and ketones, tolerating numerous functional groups.

Two-dimensional atomically flat sheets with a high mechanical flexibility are very attractive as ultrathin membranes but are also inherently challenging for microscopic investigations. We report on a method using Scanning Tunneling Microscopy (STM) under ultra-high vacuum conditions for non-indenting low-force spectroscopy on micrometer-sized freestanding graphene membranes. The method is based on applying quasi-static voltage ramps with active feedback at low tunneling currents and ultimately relies on the attractive electrostatic force between the tip and the membrane. As a result a bulge-test scenario can be established. The convenience and simplicity of the method relies on the fact that the loading force and the membrane deflection detection are both provided simultaneously by the STM. This permits the continuous measurement of the stress-strain relation. Electrostatic forces applied are typically below 1 nN and the membrane deflection is detected at sub-nanometer resolution. Experiments on single-layer graphene membranes with a strain of 0.1% reveal a two-dimensional elastic modulus E = 220 N m.