This paper presents a robust method for defect detection in textures, entropy-based automatic selection of the wavelet decomposition level (EADL), based on a wavelet reconstruction scheme, for detecting defects in a wide variety of structural and statistical textures. Two main features are presented. One of the new features is an original use of the normalized absolute function value (NABS) calculated from the wavelet coefficients derived at various different decomposition levels in order to identify textures where the defect can be isolated by eliminating the texture pattern in the first decomposition level. The second is the use of Shannon’s entropy, calculated over detail subimages, for automatic selection of the band for image reconstruction, which, unlike other techniques, such as those based on the co-occurrence matrix or on energy calculation, provides a lower decomposition level, thus avoiding excessive degradation of the image, allowing a more accurate defect segmentation. A metric analysis of the results of the proposed method with nine different thresholding algorithms determined that selecting the appropriate thresholding method is important to achieve optimum performance in defect detection. As a consequence, several different thresholding algorithms depending on the type of texture are proposed.
It appears clear that the future of road transport is going through enormous changes (intelligent transport systems), the main one being the Intelligent Vehicle (IV). Automated driving requires a huge research effort in multiple technological areas: sensing, control, and driving algorithms. We present a comprehensible and reliable platform for autonomous driving technology development as well as for testing purposes, developed in the Intelligent Vehicles Lab at the Technical University of Cartagena. We propose an open and modular architecture capable of easily integrating a wide variety of sensors and actuators which can be used for testing algorithms and control strategies. As a proof of concept, this paper presents a reliable and complete navigation application for a commercial vehicle (Renault Twizy). It comprises a complete perception system (2D LIDAR, 3D HD LIDAR, ToF cameras, Real-Time Kinematic (RTK) unit, Inertial Measurement Unit (IMU)), an automation of the driving elements of the vehicle (throttle, steering, brakes, and gearbox), a control system, and a decision-making system. Furthermore, two flexible and reliable algorithms are presented for carrying out global and local route planning on board autonomous vehicles.
A new online visual inspection technique is proposed, based on a wavelet reconstruction scheme over images obtained from the hull. This type of visual inspection to detect defects in hull surfaces is commonly carried out at shipyards by human inspectors before the hull repair task starts. We propose the use of Shannon entropy for automatic selection of the band for image reconstruction which provides a low decomposition level, thus avoiding excessive degradation of the image, allowing more precise defect segmentation. The proposed method here is capable of on-line assisting to a robotic system to perform grit blasting operations over damage areas of ship hulls. This solution allows a reliable and cost-effective operation for hull grit spot blasting. A prototype of the automated blasting system has been developed and tested in the Spanish NAVANTIA shipyards.
Generating sequences of random numbers or bits is a necessity in many situations (cryptography, modeling, simulations, etc. . .). Those sequences must be random in the sense that their behavior should be unpredictable. For example, the security of many cryptographic systems depends on the generation of unpredictable values to be used as keys. Since randomness is related to the unpredictable property, it can be described in probabilistic terms, studying the randomness of a sequence by means of a hypothesis test. A new statistical test for randomness of bit sequences is proposed in the paper. The created test is focused on determining the number of different fixed length patterns that appear along the binary sequence. When 'few' distinct patterns appear in the sequence, the hypothesis of randomness is rejected. On the contrary, when 'many' different patterns appear in the sequence, the hypothesis of randomness is accepted.The proposed can be used as a complement of other statistical tests included in suites to study randomness. The exact distribution of the test statistic is derived and, therefore, it can be applied to short and long sequences of bits. Simulation results showed the efficiency of the test to detect deviation from randomness that other statistical tests are not able to detect. The test was also applied to binary sequences obtained from some pseudorandom number generators providing results in keeping with randomness. The proposed test distinguishes by fast computation when the critical values are previously calculated.
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